Dynamical friction coefficient maps using a scanning force and friction microscope

Labardi, M.; Allegrini, M.; Salerno, Marco; Frediani, C.; Ascoli, C.

doi:10.1007/bf00348412

Cited by 56 publications

(30 citation statements)

References 19 publications

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“…The torsion of measuring console in one scan area substantially changes the skin friction at above mentioned parts indicating that the surface of the material is non-homogeneous [12,13]. In this regard, the more detail study of the morphology of parts A and B is of great interest and importance.…”

Section: Resultsmentioning

confidence: 99%

AFM SURFACE ANALYSIS OF Fe-Co-Mo ELECTROLYTIC COATINGS

Yermolenko¹,

Ved²,

Сахненко³

et al. 2017

Him. Fiz. Tehnol. Poverhni

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Section: Resultsmentioning

confidence: 99%

AFM SURFACE ANALYSIS OF Fe-Co-Mo ELECTROLYTIC COATINGS

Yermolenko¹,

Ved²,

Сахненко³

et al. 2017

Him. Fiz. Tehnol. Poverhni

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“…8). Applying the method presented in [7], two images may be "synchronized" using simple image processing. The idea is to introduce a shift of one of the images along direction of scanning.…”

Section: Results Of Sfm Studiesmentioning

confidence: 99%

Scanning Force Microscopy Studies of Implanted Silicon Crystals

et al. 1996

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Scanning force microscope has been applied to investigate wear tracks produced during friction coefficient measurements of hard steel ball against (111) silicon crystals implanted with Ar ions. Such treatment causes the stable and significant decrease in friction, despite the total removal of implanted species from the wear track during friction. Scanning force microscope measurements of wear tracks topography supported the former hypothesis assuming the formation of post-implantation dense microcracks structure and subsequent propagation of this structure into the bulk. Such process assures small size of wear particles and a low friction coefficient value. Additionally the microfriction force measurement method was applied to determine the friction coefficient of Si3 N4 cantilever and a wear track in Si crystal.

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“…[1][2][3][4][5][6][7][8][9][10] Contact between solid surfaces is generally via a multitude of asperities that together constitute the microscopic roughness of any real surface. In AFM/LFM, the contact between the tip and the surface is usually assumed to be of a single asperity nature; 7 this is a good assumption, and can be helpful in understanding multiasperity behavior.…”

Section: Methodsmentioning

confidence: 99%

“…Because of this, several methods have been developed for measuring or calculating the cantilever spring constants. [12][13][14][15][17][18][19][20][21][22][23][24][25][26][27] Usually, the cantilever is calibrated for the specific equipment used, 7,9,19,[28][29][30][31][32][33] but the accuracy obtained for spring constant values frequently is low. Due to the uncertainty in material properties and cantilever thickness, 26 the calculated spring constants k can have large relative errors of 40%-45% and 30%-35% ͑assuming uniform thickness͒ for V-shaped and single beam cantilevers, respectively.…”

Section: Methodsmentioning

confidence: 99%

Novel method for measuring nanofriction by atomic force microscope

Salvadori

Lisboa

Fernandes

et al. 2008

Journal of Vacuum Science &Amp; Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena

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The authors describe a novel approach to the measurement of nanofriction, and demonstrate the application of the method by measurement of the coefficient of friction for diamondlike carbon ͑DLC͒ on DLC, Si on DLC, and Si on Si surfaces. The technique employs an atomic force microscope in a mode in which the tip moves only in the z ͑vertical͒ direction and the sample surface is sloped. As the tip moves vertically on the sloped surface, lateral tip slipping occurs, allowing the cantilever vertical deflection and the frictional ͑lateral͒ force to be monitored as a function of tip vertical deflection. The advantage of the approach is that cantilever calibration to obtain its spring constants is not necessary. Using this method, the authors have measured friction coefficients, for load range 0 Ͻ L Ͻ 6 N, of 0.047Ϯ 0.002 for Si on Si, 0.0173Ϯ 0.0009 for Si on DLC, and 0.0080Ϯ 0.0005 for DLC on DLC. For load range 9 Ͻ L Ͻ 13 N, the DLC on DLC coefficient of friction increased to 0.051Ϯ 0.003.

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Dynamical friction coefficient maps using a scanning force and friction microscope

Cited by 56 publications

References 19 publications

AFM SURFACE ANALYSIS OF Fe-Co-Mo ELECTROLYTIC COATINGS

AFM SURFACE ANALYSIS OF Fe-Co-Mo ELECTROLYTIC COATINGS

Scanning Force Microscopy Studies of Implanted Silicon Crystals

Novel method for measuring nanofriction by atomic force microscope

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