1996
DOI: 10.12693/aphyspola.89.315
|View full text |Cite
|
Sign up to set email alerts
|

Scanning Force Microscopy Studies of Implanted Silicon Crystals

Abstract: Scanning force microscope has been applied to investigate wear tracks produced during friction coefficient measurements of hard steel ball against (111) silicon crystals implanted with Ar ions. Such treatment causes the stable and significant decrease in friction, despite the total removal of implanted species from the wear track during friction. Scanning force microscope measurements of wear tracks topography supported the former hypothesis assuming the formation of post-implantation dense microcracks structu… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
6
0

Year Published

1998
1998
2007
2007

Publication Types

Select...
9

Relationship

3
6

Authors

Journals

citations
Cited by 10 publications
(6 citation statements)
references
References 8 publications
(13 reference statements)
0
6
0
Order By: Relevance
“…A home-built atomic force microscope [19] was used to measure the interaction force between proteins. Force-distance curves were recorded at different retraction velocities ranging from 0.2 to 1.7 µm/s.…”
Section: Atomic Force Microscopymentioning
confidence: 99%
“…A home-built atomic force microscope [19] was used to measure the interaction force between proteins. Force-distance curves were recorded at different retraction velocities ranging from 0.2 to 1.7 µm/s.…”
Section: Atomic Force Microscopymentioning
confidence: 99%
“…The topography of Con A-modified surfaces was measured using a homemade atomic force microscope [34], working in contact mode. Commercially available silicon nitride cantilevers with a spring constant of 0.01 N/m (Veeco) were used for imaging.…”
Section: Atomic Force Microscopy (Afm)mentioning
confidence: 99%
“…Surface topography formed in the course of spin-casting was examined by AFM working in contact mode. Images were recorded in air at room temperature 29,59 with the home-built 57 AFM apparatus 59 and with CP Park Scientific Instruments AFM microscope. 29 Film thickness 〈h〉 was determined from AFM images taken after partial removal of the polymer film by a scalpel scratch.…”
Section: Characterization Of Polymer Blendmentioning
confidence: 99%