In this study we have investigated electrical characteristics of test cells of phase-change memory using the active materials of, respectively, Ga 3 Te 2 Sb 12 and Ge 2 Sb 2 Te 5 . Results revealed that our Ga 3 Te 2 Sb 12 device possesses an outstanding performance of a lower reset current. Beside, the archival retention for ten years can be safely stored at 180 o C.