“…6) Recently, many researchers have studied O, C, and N precipitates in mc-Si by Fourier transform infrared spectroscopy (FTIR). [7][8][9][10] Lu et al 9) investigated the relationship between the N precipitates, Si 3 N 4 , and the O precipitates, SiO 2 , in polycrystalline sheet silicon. Precipitates consisting of N and O, such as the oxynitride Si 2 N 2 O, have also been reported.…”