Diagnosis for scan-based BIST: reaching deep into the signatures

Bayraktaroglu, I.; Orailoğlu, Alex

doi:10.1109/date.2001.915008

Cited by 12 publications

(6 citation statements)

References 9 publications

(27 reference statements)

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“…Space diagnosis refers to the identification of failing (error-capturing) scan cells. A number of space diagnosis techniques have been proposed in the literature [4,5,23,29]. These techniques provide a small set of candidate failing scan cells out of the tens of thousands of scan cells in large ICs.…”

Section: Introductionmentioning

confidence: 99%

A Signature Analysis Technique for the Identification of Failing Vectors with Application to Scan-BIST*

et al. 2004

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Abstract. We present a new technique for uniquely identifying a single failing vector in an interval of test vectors. This technique is applicable to combinational circuits and for scan-BIST in sequential circuits with multiple scan chains. The proposed method relies on the linearity properties of the MISR and on the use of two test sequences, which are both applied to the circuit under test. The second test sequence is derived from the first in a straightforward manner and the same test pattern source is used for both test sequences. If an interval contains only a single failing vector, the algebraic analysis is guaranteed to identify it. We also show analytically that if an interval contains two failing vectors, the probability that this case is interpreted as one failing vector is very low. We present experimental results for the ISCAS benchmark circuits to demonstrate the use of the proposed method for identifying failing test vectors.

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Section: Introductionmentioning

confidence: 99%

A Signature Analysis Technique for the Identification of Failing Vectors with Application to Scan-BIST*

et al. 2004

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“…Previous research has mostly focused on finding the failing scan cells [8,2,3,10] or failing test vectors [9,4]. Even though failing scan chain identification has been successfully performed, identification of failing test vectors has had no practical solution so far due to the high number of failing test vectors.…”

Section: Introductionmentioning

confidence: 99%

“…While for identification of fault embedding scan cells any of the previously suggested schemes [8,2,3,10,4] can be utilized, for failing test vector identification we propose to acquire additional signatures during test application. Additional signatures are to be captured for a small set of initial vectors individually and for the rest of the vectors in larger groups.…”

Section: Introductionmentioning

confidence: 99%

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Gate level fault diagnosis in scan-based BIST

Bayraktaroglu¹,

Orailoglu²

Proceedings 2002 Design, Automation and Test in Europe Conference and Exhibition

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A gate level, automated fault diagnosis scheme is proposed for scan-based BIST designs. The proposed scheme utilizes both fault capturing scan chain information and failing test vector information and enables location identification of single stuck-at faults to a neighborhood of a few gates through set operations on small pass/fail dictionaries. The proposed scheme is applicable to multiple stuck-at faults and bridging faults as well. The practical applicability of the suggested ideas is confirmed through numerous experimental runs on all three fault models.

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“…The former refers to the set of scan cells that capture errors during the BIST session. This problem has received a lot of attention recently, and a number of methods involving scan chain partitioning methods with multiple test sessions have been proposed for precisely identifying the failing scan cells [4][5][6][7]. A more difficult problem in scan-BIST diagnosis is that of identifying the set of failing vectors.…”

Section: Introductionmentioning

confidence: 99%