Gate level fault diagnosis in scan-based BIST

Bayraktaroglu, I.; Orailoglu, A.

doi:10.1109/date.2002.998301

“…In indirect diagnosis, the failing signatures are analyzed and the logic values captured by the scan elements are computed for each pattern in the pattern block. This procedure usually requires several test sessions [13], [14], [15], [16], [17], [18], [19]. Diagnosis algorithms for combinational logic can then be applied to the resulting failure information [20], [21], [22], [23].…”

Section: Built-in Diagnosismentioning

confidence: 99%

Diagnostic Test of Robust Circuits

Cook

¹

,

Hellebrand

²

,

Indlekofer

³

et al. 2011

2011 Asian Test Symposium

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Robust circuits are able to tolerate certain faults, but also pose additional challenges for test and diagnosis. To improve yield, the test must distinguish between critical faults and such faults, that could be compensated during system operation; in addition, efficient diagnosis procedures are needed to support yield ramp-up in the case of critical faults. Previous work on circuits with time redundancy has shown that "signature rollback" can distinguish critical permanent faults from uncritical transient faults. The test is partitioned into shorter sessions, and a rollback is triggered immediately after a faulty session. If the repeated session shows the correct result, then a transient fault is assumed. The reference values for the sessions are represented in a very compact format. Storing only a few bits characterizing the MISR state over time can provide the same quality as storing the complete signature. In this work the signature rollback scheme is extended to an integrated test and diagnosis procedure. It is shown that a single test run with highly compacted reference data is sufficient to reach a comparable diagnostic resolution to that of a diagnostic session without any data compaction.

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“…The first group relies on the standard BIST architecture also referred to as STUMPS architecture [2]. The diagnosis methods proposed for this architecture are based on repeated test sessions, where the bandwidth necessary for the repetitions is not suitable for in-field scenarios and the test repetitions themselves already cause overhead in terms of test time [3], [4], [5], [6], [7]. The second diagnosis technique for random logic BIST relies on a dedicated hardware architecture [8].…”

Section: Introductionmentioning

confidence: 99%

Structural In-Field Diagnosis for Random Logic Circuits

Cook

¹

,

Elm

²

,

Wunderlich

³

et al. 2011

2011 Sixteenth IEEE European Test Symposium

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In-field diagnosability of electronic components in larger systems such as automobiles becomes a necessity for both customers and system integrators. Traditionally, functional diagnosis is applied during integration and in workshops for infield failures or break-downs. However, functional diagnosis does not yield sufficient coverage to allow for short repair times and fast reaction on systematic failures in the production. Structural diagnosis could yield the desired coverage, yet recent builtin architectures which could be reused in the field either do not reveal diagnostic information or necessitate dedicated test schemes.The paper at hand closes this gap with a new built-in test method for autonomous in-field testing and in-field diagnostic data collection. The proposed Built-In Self-Diagnosis method (BISD) is based on the standard BIST architecture and can seamlessly be integrated with recent, commercial DfT techniques. Experiments with industrial designs show that its overhead is marginal and its structural diagnostic capabilities are comparable to those of external diagnosis on high-end test equipment.

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“…The test sessions may target specific scan elements [3], [4], [5], [6], work on different pattern sets [7], or employ different response compactors [9], [10]. Once a set of faulty signatures is identified, logic diagnosis can proceed following one of two approaches.…”

Section: State Of the Artmentioning

confidence: 99%

“…The first group relies on the standard BIST architecture also referred to as STUMPS architecture [2]. The diagnosis methods proposed for this architecture are based on repeated test sessions, where the bandwidth necessary for the repetitions is not suitable for in-field scenarios and the test repetitions themselves already cause overhead in terms of test time [3], [4], [5], [6], [7]. The second diagnosis technique for random logic BIST relies on a dedicated hardware architecture [8].…”

Section: Introductionmentioning

confidence: 99%

A Depth-Universal Circuit

Cook¹,

Hoover²

1985

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In-field diagnosability of electronic components in larger systems such as automobiles becomes a necessity for both customers and system integrators. Traditionally, functional diagnosis is applied during integration and in workshops for infield failures or break-downs. However, functional diagnosis does not yield sufficient coverage to allow for short repair times and fast reaction on systematic failures in the production. Structural diagnosis could yield the desired coverage, yet recent builtin architectures which could be reused in the field either do not reveal diagnostic information or necessitate dedicated test schemes. The paper at hand closes this gap with a new built-in test method for autonomous in-field testing and in-field diagnostic data collection. The proposed Built-In Self-Diagnosis method (BISD) is based on the standard BIST architecture and can seamlessly be integrated with recent, commercial DfT techniques. Experiments with industrial designs show that its overhead is marginal and its structural diagnostic capabilities are comparable to those of external diagnosis on high-end test equipment. Preprint General Copyright NoticeThis article may be used for research, teaching and private study purposes. Any substantial or systematic reproduction, re-distribution, re-selling, loan or sub-licensing, systematic supply or distribution in any form to anyone is expressly forbidden. This is the author's "personal copy" of the final, accepted version of the paper published by IEEE. Abstract-In-field diagnosability of electronic components in larger systems such as automobiles becomes a necessity for both customers and system integrators. Traditionally, functional diagnosis is applied during integration and in workshops for infield failures or break-downs. However, functional diagnosis does not yield sufficient coverage to allow for short repair times and fast reaction on systematic failures in the production. Structural diagnosis could yield the desired coverage, yet recent builtin architectures which could be reused in the field either do not reveal diagnostic information or necessitate dedicated test schemes.The paper at hand closes this gap with a new built-in test method for autonomous in-field testing and in-field diagnostic data collection. The proposed Built-In Self-Diagnosis method (BISD) is based on the standard BIST architecture and can seamlessly be integrated with recent, commercial DfT techniques. Experiments with industrial designs show that its overhead is marginal and its structural diagnostic capabilities are comparable to those of external diagnosis on high-end test equipment.

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Gate level fault diagnosis in scan-based BIST

Cited by 10 publications

References 9 publications

Diagnostic Test of Robust Circuits

Diagnostic Test of Robust Circuits

Structural In-Field Diagnosis for Random Logic Circuits

A Depth-Universal Circuit

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