We propose in this paper an extension on the Scan Chain Concealment technique to further reduce test time and volume requirement. The proposed methodology stems from the architecture of the existing SCC scheme, while it attempts to overlap consecutive test vector seeds, thus providing increased flexibility in exploiting effectively the large volume of don't-care bits in test vectors. We also introduce modified ATPG algorithms upon the previous SCC scheme and explore various implementation strategies. Experimental data exhibit significant reductions on test time and volume over all current test compression techniques.
A gate level, automated fault diagnosis scheme is proposed for scan-based BIST designs. The proposed scheme utilizes both fault capturing scan chain information and failing test vector information and enables location identification of single stuck-at faults to a neighborhood of a few gates through set operations on small pass/fail dictionaries. The proposed scheme is applicable to multiple stuck-at faults and bridging faults as well. The practical applicability of the suggested ideas is confirmed through numerous experimental runs on all three fault models.
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