A Signature Analysis Technique for the Identification of Failing Vectors with Application to Scan-BIST*

Abstract

Abstract. We present a new technique for uniquely identifying a single failing vector in an interval of test vectors. This technique is applicable to combinational circuits and for scan-BIST in sequential circuits with multiple scan chains. The proposed method relies on the linearity properties of the MISR and on the use of two test sequences, which are both applied to the circuit under test. The second test sequence is derived from the first in a straightforward manner and the same test pattern source is used for both test sequences. If an interval contains only a single failing vector, the algebraic analysis is guaranteed to identify it. We also show analytically that if an interval contains two failing vectors, the probability that this case is interpreted as one failing vector is very low. We present experimental results for the ISCAS benchmark circuits to demonstrate the use of the proposed method for identifying failing test vectors.

One approach to compact testing of digital circuits

“…Built-in test aids are of great importance, for example, in large and extra-large integrated circuits development [3][4]. The methodology of digital systems diagnosis based on transformation of binary sequences coming to the DO into compact specifi cations --signatures, comparison of obtained signatures with reference signatures, and corresponding processing of comparison results --are the essence of signature analysis [5][6][7]. As a rule, mathematical tools from antinoise coding theory are used as a theoretical apparatus for signature analyzer development.…”