This article investigates the Zero-Temperature-Coefficient (ZTC) bias point
and its associated performance metrics of a High-k Metal Gate (HKMG)
DG-MOSFET in nanoscale. The ZTC bias point is defined as the point at which
the device parameters are independent of temperature. The discussion includes
sub threshold slope (SS), drain induced barrier lowering (DIBL), on-off
current ratio (Ion/Ioff), transconductance (gm), output conductance (gd) and
intrinsic gain (AV). From the results, it is confirmed that there are two
different ZTC bias points, one for IDS (ZTCIDS) and the other for gm (ZTCgm).
The points are obtained as: ZTCIDS=0.552 V and ZTCgm =0.410 V, which will
open important opportunities in analog circuit design for wide range of
temperature applications.