Development of a total reflection X-ray fluorescence spectrometer for ultra-trace element analysis

Abstract

A simple and fairly inexpensive total reflection X-ray fluorescence (TXRF) spectrometer has been designed, constructed and realized. The spectrometer is capable of ultra-trace multielement analysis as well as performs surface characterization of thin films. The TXRF setup comprises of an X-ray generator, a slitcollimator arrangement, a monochromator/cutoff-stage, a sample reflector stage and an X-ray detection system. The glancing angle of incidence on the two reflectors is implemented using a sine-bar mechanism that enables precise angle adjustments. An energy dispersive detector and a GM counter are employed for measuring respectively the fluorescence intensities and the direct X-ray beam intensity. A Cu-target X-ray generator with its line focus window is used as an excitation source. The spectrometer is quite portable with its compact design and use of a peltier cooled solid state detector for energy dispersive detection. Alignment and characterization of the TXRF system has been performed and the minimum detection limits for various elements have been determined to be in the range of 100 pg to 5 ng even at low X-ray generator powers of 30 kV, 5 mA. The capability of the TXRF system developed for thin film characterization is also demonstrated.

Sample Preparation for Evaluation of Detection Limits in X-ray Fluorescence Spectrometry

“…To perform the same studies using the TXRF technique, researchers have used the indigenously developed TXRF spectrometer. 26 Aqueous residues of U of different concentrations were prepared from liquid solutions and polished Si substrates were used as the sample carriers. Mo X-ray tube (17.4 keV) was used as the excitation source.…”

Non-destructive surface characterization of float glass: X-ray reflectivity and grazing incidence X-ray fluorescence analysis

“…Total reflection X-ray fluorescence measurements were performed on an in-house developed TXRF spectrometer [23]. The fluorescence data were taken using a Peltier cooled solid state detector [Eurisys Mesures EPXR 10-300, 10 mm 2 area], a spectroscopy amplifier AMP 6300 and a multichannel pulse height analyzer installed in a personal computer.…”

Effect of Energy Dependence of Primary Beam Divergence on the X-ray Standing Wave Characterization of Layered Materials

“…29,30 A 4.0 kW standalone PHILIPS X-ray generator having Cu, Mo and W targets was used as an excitation source. The fluorescence measurements were done using a Peltier cooled solid state detector (FWHM ~240 eV at 5.9 keV), a spectroscopy amplifier AMP-6300 and an 8 K multichannel pulse height analyzer installed in a personal computer.…”