2005
DOI: 10.1016/j.jnoncrysol.2005.05.026
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Non-destructive surface characterization of float glass: X-ray reflectivity and grazing incidence X-ray fluorescence analysis

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Cited by 5 publications
(3 citation statements)
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References 31 publications
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“…For TXRF measurements a self-assembled TXRF spectrometer at Raja Ramanna Centre of Advanced Technology (RRCAT) Indore, India was used [1,2]. A monochromatized Mo K α source obtained from the Mo target tube operated at 30 kV and 20 mA using a W-C multilayer was used.…”
Section: Instrumentationmentioning
confidence: 99%
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“…For TXRF measurements a self-assembled TXRF spectrometer at Raja Ramanna Centre of Advanced Technology (RRCAT) Indore, India was used [1,2]. A monochromatized Mo K α source obtained from the Mo target tube operated at 30 kV and 20 mA using a W-C multilayer was used.…”
Section: Instrumentationmentioning
confidence: 99%
“…A monochromatized Mo K α source obtained from the Mo target tube operated at 30 kV and 20 mA using a W-C multilayer was used. The samples were deposited on float glass supports [2]. The live time used varied from 1000 to 3000 s depending on the intensity of U L α peak.…”
Section: Instrumentationmentioning
confidence: 99%
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