Development of a parametric optical constant model for Hg1−xCdxTe for control of composition by spectroscopic ellipsometry during MBE growth

Characterization of Nanocrystals Using Spectroscopic Ellipsometry

“…Another general approach for the parameterization of the critical point features of the dielectric function is the generalized critical point model suggested by B. Johs et al [19]. In this model the dielectric function around the critical point is described by four Gaussian-broadened polynomials.…”

Enhanced Growth Rate and Silane Utilization in Amorphous Silicon and Nanocrystalline-Silicon Solar Cell Deposition via Gas Phase Additives

“…Nanocrystalline Si:H (nc-Si:H), denoted by  is represented by a model using a parametric critical point structure based on the joint density of states. 7 The optical properties of the components of the surface roughness layer are represented by a Bruggeman effective medium approximations 8 (EMA) consisting of variable fractions of bulk…”

Oxygen plasma effects on optical properties of ZnSe films

“…The mathematical details of this model are beyond the scope of this article, but can be found elsewhere. [52][53][54] It is worth mentioning, however, that the HJ model is somewhat similar to Kim and Garland's model in the sense that they both use Gaussian broadening and polynomials for the absorption basis functions. However, instead of spanning between critical points, the polynomials are centered around them in the HJ model.…”

“…In addition, Gaussian broadening is better modeled, yet is KK consistent. 54 For ellipsometric data analysis over wide spectral range, the ability to correctly model above, below, and through the direct gap is essential, which is why we chose the HJ model. Model parameters can be determined from direct fits of ellipsometric data without the need to fit derivative data.…”

“…Details of the entire procedure would be too lengthy to describe here, and we refer the interested reader to Ref. [52][53][54]. The HJ parameters for the ZnSe optical constants, ZnSe thickness, and surface roughness layer thickness were fit simultaneously.…”