Determining Realistic Parameters for the &lt;newline/&gt; Double Exponential Law that Models&lt;newline/&gt; Transient Current Pulses

Wrobel, Frédéric; Dilillo, Luigi; Touboul, Antoine; Pouget, Vincent; Saigné, Frédéric

doi:10.1109/tns.2014.2299762

Cited by 40 publications

(25 citation statements)

References 12 publications

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“…The transient current pulses were modelled by utilizing the double exponential law and incorporated into the simulations using Verilog-A. The double exponential current pulse is expressed as [60]- [62]:…”

Section: Circuits Under Testmentioning

confidence: 99%

Single Event Transients and Pulse Quenching Effects in Bandgap Reference Topologies for Space Applications

Andreou

Javanainen

Rominski

et al. 2016

IEEE Trans. Nucl. Sci.

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Abstract-An architectural performance comparison of bandgap voltage reference variants, designed in a 0.18 µm CMOS process, is performed with respect to single event transients. These are commonly induced in microelectronics in the space radiation environment. Heavy ion tests (Silicon, Krypton, Xenon) are used to explore the analog single-event transients and have revealed pulse quenching mechanisms in analogue circuits. The different topologies are compared, in terms of cross-section, pulse duration and pulse amplitude. The measured results, and the explanations behind the findings, reveal important guidelines for designing analog integrated circuits, which are intended for space applications. The paper includes an analysis on how pulse quenching occurs within the indispensable current mirror, which is used in every analog circuit.

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Section: Circuits Under Testmentioning

confidence: 99%

Single Event Transients and Pulse Quenching Effects in Bandgap Reference Topologies for Space Applications

Andreou

Javanainen

Rominski

et al. 2016

IEEE Trans. Nucl. Sci.

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“…The previous studies can be categorized into two groups: 1) Soft error characterization studies [2,12,13,14]: The first step of characterization is the generation of soft errors, which models the physical effects of particle strike as current pulses at the striking nodes. A number of current models, such as Weibull function [14], exponential current pulse [15], and double exponential current model [4,5,16,11], have been adopted by different circuit level SER estimation works.…”

Section: Related Workmentioning

confidence: 99%

“…A number of current models, such as Weibull function [14], exponential current pulse [15], and double exponential current model [4,5,16,11], have been adopted by different circuit level SER estimation works. Double exponential current model is one of the most widely accepted models in the circuit level works, and several works [2,14] have concentrated on determining technology dependent parameters in the double exponential formula. In addition to the soft error generation related works, the authors in [16] proposed a soft error characterization method that captured the pulse widths of SETs, whereas the authors in [12] considered both pulse widths and pulse heights of SETs during soft error characterization.…”

Section: Related Workmentioning

confidence: 99%

“…With the advent of nanoscale computing, soft errors have become one of the most challenging issues that impact the reliability of modern electronic systems at ground level for the semiconductor industry [1,2]. A radiation-induced soft error occurs in a semiconductor device when the free mobile carriers generated by the passage of an energetic radiation particle are collected by the depletion region of a reverebiased p-n junction [3,4].…”

Section: Introductionmentioning

confidence: 99%

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Accelerating soft-error-rate (SER) estimation in the presence of single event transients

Draper

2016

Proceedings of the 53rd Annual Design Automation Conference

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Radiation-induced soft errors have posed an ever increasing reliability challenge as device dimensions keep shrinking in advanced CMOS technology. Therefore, it is imperative to devise fast and accurate soft error rate (SER) estimation methods. Previous works mainly focus on improving the accuracy of the SER results, whereas the speed improvement is limited to partitioning and parallel processing. This paper presents an efficient SER estimation framework for combinational logic circuits in the presence of single-event transients (SETs). A novel top-down memoization algorithm is proposed to accelerate the propagation of SETs. Experimental results of a variety of benchmark circuits demonstrate that the proposed approach achieves up to 560.2X times speedup with less than 3% difference in terms of SER results compared with the baseline algorithm.

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“…In practice, only the total charge and the falling time are necessary [19]. From the data and conclusions in [19], we will postulate that the fall time, τ F , is 250 ps and that τ R is a fifth of τ F . Thus, the pulse is not longer than 1 ns.…”

Section: ) Role Of Parasitic Resistancesmentioning

confidence: 99%

SPICE Simulations of Single Event Transients in Bipolar Analog Integrated Circuits Using Public Information and Free Open Source Tools

Franco

Palomar

Izquierdo

et al. 2015

IEEE Trans. Nucl. Sci.

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Abstract-This paper proposes a technique to build SPICE micromodels of integrated circuits in bipolar technology appropriate to simulate single event transients. First of all, we will show how to obtain SPICE models of the internal transistors from texts in the scientific and academic literature. Next, several strategies to figure out the internal structure of the integrated circuits and bias point will be shown. Finally, simulation results will be compared to data issue from experiments, either performed by the authors or by other researchers. As the simulations do not require expensive software or hardware, this paper can be a start point for research groups with small budget or for academic purposes at universities.

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Determining Realistic Parameters for the <newline/> Double Exponential Law that Models<newline/> Transient Current Pulses

Cited by 40 publications

References 12 publications

Single Event Transients and Pulse Quenching Effects in Bandgap Reference Topologies for Space Applications

Single Event Transients and Pulse Quenching Effects in Bandgap Reference Topologies for Space Applications

Accelerating soft-error-rate (SER) estimation in the presence of single event transients

SPICE Simulations of Single Event Transients in Bipolar Analog Integrated Circuits Using Public Information and Free Open Source Tools

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