2012
DOI: 10.1109/jqe.2012.2187176
|View full text |Cite
|
Sign up to set email alerts
|

Detailed Analysis on the Spectral Response of InP/InGaAs HPTs for Optoelectronic Applications

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1

Citation Types

0
4
0

Year Published

2014
2014
2021
2021

Publication Types

Select...
5

Relationship

0
5

Authors

Journals

citations
Cited by 11 publications
(4 citation statements)
references
References 21 publications
0
4
0
Order By: Relevance
“…What is more, under 0-0.3 V bias, the total current increases monotonously as the thickness of intrinsic layer increases. The notch in emitter is an obstacle for holes injection from emitter to base, and the knee voltage of the HPT is proportional to the depth of the valence band notch in emitter [19]. Figure 7 shows the photoresponse and S/N as functions of graded composition of the base.…”
Section: Resultsmentioning
confidence: 99%
“…What is more, under 0-0.3 V bias, the total current increases monotonously as the thickness of intrinsic layer increases. The notch in emitter is an obstacle for holes injection from emitter to base, and the knee voltage of the HPT is proportional to the depth of the valence band notch in emitter [19]. Figure 7 shows the photoresponse and S/N as functions of graded composition of the base.…”
Section: Resultsmentioning
confidence: 99%
“…[12][13][14] Khan et al optimized the necessary analytical expressions of the spectral response model using the doping-dependent collection efficency with the incident light radiated at the base region directly. [15] However, according to the theory of Chand, [11] the diffusion current coming from the neutral portion sub-collector should be taken into consideration in calculating the depleted-collector current, which was neglected by Khan owing to the relatively small diffusion coefficients of the minority-carrier holes in the n-type sub-collecter. Furthermore, there are many integrated devices currently employing HPTs with a floating base such as HPTs/OLEDs optical upconverter [16,17] and HPTs/LDs, [18,19] which require the light radiated from the emitter of the HPTs.…”
Section: Introductionmentioning
confidence: 99%
“…The epitaxial layer structure of this device consists of a p-type InP layer as emitter, a thin n-type In 0.53 Ga 0.47 As layer as base, and a p-type In 0.53 Ga 0.47 As layer as collector. Unlike the structure of Khan et al, [15,20,21] the emitter/base junction and the collector/sub-collector junction in our model are neither exposed to the air nor contacted to the metal. So not only the photo-generated minority carriers but also the thermal equilibrium minority carriers electrons (holes) in these regions should be taken into account in the boundary conditions of the spectral response model.…”
Section: Introductionmentioning
confidence: 99%
“…The optic generated holes dismissed/drifted slowly from collector to emitter, which restricted the device high frequency performance and thus the photoelectric response speed. [4][5][6][7] The uni-traveling-carrier (UTC) idea was first proposed and applied to a photo-detector (PD) to make only one carrier (the electron) across the base and collector junction area. [8][9][10][11][12] UTC-PD had a faster response speed, higher saturation current, and wider linear dynamic range than the traditional PD detector.…”
Section: Introductionmentioning
confidence: 99%