2015
DOI: 10.3844/ajeassp.2015.318.327
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Deposition and Characterization of CdS Nano Thin Film with Complexing Agent Triethanolamine

Abstract: Abstract:The equimolar concentration thin films of Cadmium Sulfide (Cd x S x ) with the complexing agent TEA were deposited on a glass substrate by the SILAR technique. The crystalline nature with face centered cubic crystal system of the CdS films is determined from Xray diffraction analysis. The broadened diffraction peaks indicated nano sized particles of the film materials. The surface morphology of the films was studied by SEM analysis. The Energy Dispersive Analysis of X-ray (EDAX) plot confirms the equi… Show more

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Cited by 30 publications
(12 citation statements)
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References 27 publications
(28 reference statements)
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“…4 The XRD spectra of CdS thin films spin coated at 2000 rpm using CdS solution of with and without surfactant with thiol-amine co-solvents and annealed at 300 °C for 5 min Fig. 5 The Raman spectra of a CdS thin films synthesized from CdS solution with and without surfactant annealed at 300 °C for 5 min and b The change of Raman peak intensity with peak position Due to C-S vibrational mode, another peak assigned at 1383 cm −1 and C-N symmetry stretching indicated by the bands at 1120 cm −1 and C-O stretching vibration at 1001 cm −1 were observed, respectively and the result are in good agreement with earlier-reported works [63][64][65]. Another peak detected around 670 cm −1 is due to the Cd-S vibrational mode which agrees well with reported value of [66].…”
Section: Xrd Study Of Cds Thin Filmssupporting
confidence: 88%
“…4 The XRD spectra of CdS thin films spin coated at 2000 rpm using CdS solution of with and without surfactant with thiol-amine co-solvents and annealed at 300 °C for 5 min Fig. 5 The Raman spectra of a CdS thin films synthesized from CdS solution with and without surfactant annealed at 300 °C for 5 min and b The change of Raman peak intensity with peak position Due to C-S vibrational mode, another peak assigned at 1383 cm −1 and C-N symmetry stretching indicated by the bands at 1120 cm −1 and C-O stretching vibration at 1001 cm −1 were observed, respectively and the result are in good agreement with earlier-reported works [63][64][65]. Another peak detected around 670 cm −1 is due to the Cd-S vibrational mode which agrees well with reported value of [66].…”
Section: Xrd Study Of Cds Thin Filmssupporting
confidence: 88%
“…According to the Scherrer equation and assuming homogeneous tension, these peaks are consistent with the characteristic pattern of nanoparticles or small crystallites (Figure 3) [38]. In the case of CdS-NPs, a single diffraction plane at (200), corresponding to the Hawleyite mineral phase as derived from the CPDS pattern, was observed (Figure 3, CdS) [39]. NPs produced in the presence of 200 µM AgNO 3 (Figure 3, Ag 2 S) shows a single diffraction peak in the crystallographic plane (111), corresponding to the CPDS pattern of the Argentite cubic phase, Ag 2 S [40].…”
Section: Characterization Of Biosynthesized Ternary Qdssupporting
confidence: 73%
“…After the determination of phases, Miller's indexes were determined by comparison with JCPDS standards, thus concluding that the deposited film has preferential orientation and growth in the plan (111). The other plans (200) and (311) were also observed in the literature 11 and correspond to the cubic phase of the CdS. The X-ray diffraction serves as a system for identifying materials, because each atomic set has crystallographic characteristics that are unique, so we can state that the synthesized material is indeed the one planned 12 .…”
Section: Resultsmentioning
confidence: 66%
“…In Figure 2 the presence of CdS and FTO peaks were observed, according to the JOINT COMMITTEE FOR POWDER DIFFREACTION STANDARDS database (JCPDS-10-0454 for CdS and JCPDS-77-450 for FTO) 11 . After the determination of phases, Miller's indexes were determined by comparison with JCPDS standards, thus concluding that the deposited film has preferential orientation and growth in the plan (111).…”
Section: Resultsmentioning
confidence: 99%