2009
DOI: 10.1063/1.3250431
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Correlating dopant distributions and electrical properties of boron-doped silicon nanowires

Abstract: Palladium nanoparticle decorated silicon nanowire field-effect transistor with side-gates for hydrogen gas detection Appl. Phys. Lett.Electrical properties of high density arrays of silicon nanowire field effect transistors

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Cited by 47 publications
(46 citation statements)
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“…of the p-Si (n-Si) nanowire surface. 31 Ohmic contacts were simulated by implementing a Schottky model for the metal/semiconductor interfaces, and tunneling through the Schottky barrier was simulated using the Wentzel-Kramers-Brillouin approximation.…”
mentioning
confidence: 99%
“…of the p-Si (n-Si) nanowire surface. 31 Ohmic contacts were simulated by implementing a Schottky model for the metal/semiconductor interfaces, and tunneling through the Schottky barrier was simulated using the Wentzel-Kramers-Brillouin approximation.…”
mentioning
confidence: 99%
“…In Fig. 6(b), we could observe the entire core and partly shell of the nanowires, the outer facet of the nanowires observation exhibit this method have larger field of view compared with the conventional method [27] and is significant to study the properties of periphery of nanowires.…”
Section: Resultsmentioning
confidence: 95%
“…[6][7][8][9] For example, Perea et al have performed the atom probe tomography to visualize the three-dimensional dopant distributions in Ge nanowires. Such controllability is also strongly required for vapor-liquid-solid ͑VLS͒ grown semiconductor nanowires toward functional nanowire device applications.…”
mentioning
confidence: 99%