Continuing evaluation of bipolar linear devices for total dose dependency and ELDRS effects

Total Ionizing Dose and Dose Rate Effects in Candidate Spacecraft Electronic Devices

“…The detailed test results for two device types, LM139 and LM124, that were particularly sensitive to dose rate effects are presented in Figure 1 and Figure 2. As expected from previous reports [1][2][3][4][5][6], many devices exhibited some degree of sensitivity to dose rate effects. In most of cases, however, this sensitivity was not significant enough to have major practical impact for many typical spacecraft applications.…”

Bias effects on total dose-induced degradation of bipolar linear microcircuits for switched dose-rate irradiation

“…Although it is generally assumed that irradiation with all pins grounded corresponds to the worst case, it has been shown that this is not always the case [10][11][12][13].…”

Total ionizing dose effects in bipolar and BiCMOS devices

“…The bias condition during the test is an important factor for this type of devices. Previous work has shown that bipolar devices tested under zero bias condition are more sensitive to gamma irradiation damage at low dose rates than biased devices [4].…”

“…The unbiased devices were irradiated with all pins at ground potential. Bipolar devices under unbiased conditions are often more sensitive to radiation damage at low dose rates than biased devices [4]. The test procedure was in accordance with MIL-STD-883, method 1019.…”