Total Ionizing Dose and Dose Rate Effects in Candidate Spacecraft Electronic Devices

Bogorad, A.; Likar, Justin J.; Moyer, S.K.; Ditzler, A.J.; Doorley, G.P.; Herschitz, R.

doi:10.1109/redw.2008.29

Cited by 5 publications

(4 citation statements)

References 6 publications

(7 reference statements)

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“…Several literatures reveal the similar conclusions that electronics may undergo different level of degradation depending on the dosage rate exposed to [3]. ESA and MIL-STD's interpretation toward different dosage rate may be found in the Figure 2.…”

Section: B Space Grade Version Gpsrsupporting

confidence: 56%

TID testing and SEE mitigation approach of a long mission life GPS receiver using COTS parts

Cheng

Lin

Chen

2012

2012 6th ESA Workshop on Satellite Navigation Technologies (Navitec 2012) &Amp; European Workshop on GNSS Signals and Signal Pr

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Compared to conventional hardware GPS receivers (GPSR), software GPS receivers are more suitable for research and development. Software GPS receivers can be dynamically programmed in software to reconfigure the characteristics of GPS receiver and new algorithms can easily be integrated without changing the design of the hardware. However, the most important issue for this approach is the computational load. It can be solved by using the high performance state-of-art digital signal processor. The harshness of space environment, such as Total Ionizing Dosage (TID), Single Event Effect (SEE), always cast certain thread to GPS receiver intended for space applications. Common resolution to cope with this thread is the robustness of space grade EEE parts toward those effects along with the protection of circuit design. Nevertheless, the most of the state-of-art EEE parts are not space qualified. In this study, certain Commercial Off The Shelf (COTS) parts such as COTS level RF Front-End (RFFE) and Digital SignalProcessor (DSP) along with single event effect (SEE) mitigation circuit design, are considered in the proposed GPSR design for their advantages, such as availability, performance, size, weight and lead time, over regular space qualified ones.

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Section: B Space Grade Version Gpsrsupporting

confidence: 56%

TID testing and SEE mitigation approach of a long mission life GPS receiver using COTS parts

Cheng

Lin

Chen

2012

2012 6th ESA Workshop on Satellite Navigation Technologies (Navitec 2012) &Amp; European Workshop on GNSS Signals and Signal Pr

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“…Therefore, this research will use an appropriate method and concept which is the in situ method in monitoring the devices under test (DUTs) during irradiation with γ rays and Xrays. This is different from the conventional measurement methods that had been previously used that the changes in output parameter of the DUTs are analyzed after irradiated by the source [1], [7]. In situ operation in data acquisition system produces results showing gradual changes in parameters during irradiation and therefore is a more accurate monitoring system as it improved the process monitoring; reduce product variance and higher throughput.…”

Section: Introductionmentioning

confidence: 97%

Evaluation on Diffusion of Bipolar Junction Transistor (BJT) Charge-Carrier and its Dependency on Total Dose Irradiation

Amir

Chee

2013

AMR

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Electronic device that subjected to various effects by radiations can cause small interferences such as noises in the circuit. These effects are especially critical in operating environment such as outer space, where radiation comes in stronger and more frequent. In this research, analytical study on the effects of ionizing radiation induced by 60Co gamma (γ) rays in bipolar junction transistor (BJT) devices had been performed. It was found that the high energy of the radiation allows more valence electrons to be excited to the conduction band in the BJT. This leads to the production of a large number of excited atoms and increases the holes in the valence band. The increase of holes in the base region due to trapping will increase the probability of recombination and reducing the number of electrons that reaches the collector region. This ionizing radiation effect was found to arouse either a permanent or temporarily damage in the devices depending on their current drives and total dose absorbed.

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“…Since most of the research and studies are emphasizing on shielding and material study on the bipolar technology, we extended our studies to the damage extents of gamma radiation at different operating conditions and parameters. All the monitoring jobs are carried out in situ and this is different from some of the conventional measurement methods that the changes in output parameter of the DUTs are analyzed after irradiated by the source [10,11]. This conventional method provides less accuracy results because changes could only be monitored for not in-flux test.…”

Section: Introductionmentioning

confidence: 99%

Defect Generation in Bipolar Devices by Ionizing Radiation

Chee¹,

Amir²,

Salleh³

2014

IOSRJAP

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Total Ionizing Dose and Dose Rate Effects in Candidate Spacecraft Electronic Devices

Abstract: Total dose tests of common devices reveal unexpected dose rate sensitivity. Devices from the same vendor procured to SMD versus military specifications exhibit substantially different dose rate effects. Behavior and critical parameters are compared and discussed.

Cited by 5 publications

References 6 publications

TID testing and SEE mitigation approach of a long mission life GPS receiver using COTS parts

TID testing and SEE mitigation approach of a long mission life GPS receiver using COTS parts

Evaluation on Diffusion of Bipolar Junction Transistor (BJT) Charge-Carrier and its Dependency on Total Dose Irradiation

Defect Generation in Bipolar Devices by Ionizing Radiation

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