Comparison of voltages induced in an electronic equipment during far field and near field normative radiated immunity tests

Durier, A.; Dhia, Sonia Ben; Dubois, Tristan

doi:10.1109/emceurope.2019.8871798

Cited by 11 publications

(10 citation statements)

References 4 publications

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“…(1) can be rewritten to (6), where LCE and LCH are the coupling lengths associated to E and H-fields. The RS estimator (4) can be rewritten to (9).…”

Section: B Practical Implementation Of the Estimation Methodsmentioning

confidence: 99%

“…This research work aims at providing postprocessing methods of NFSI results in order to assess RS risks at the IC and PCB levels. Part I reviewed several attempts to relate the RS level to NFSI results [9]- [10]. However, these attempts require preliminary RS test results or the extraction of phase information during NFSI, which make them unpractical.…”

Section: Introductionmentioning

confidence: 99%

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On the Correlation Between Near-Field Scan Immunity and Radiated Immunity at Printed Circuit Board Level – Part II

Boyer

Nolhier

Caignet

et al. 2022

IEEE Trans. Electromagn. Compat.

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The work presented in this two-part paper focuses on a prediction method of the radiated susceptibility of integrated circuit and printed circuit board from near-field scan injection, in order to anticipate risks of non-compliance due to design weakness. In Part I, a worst-case estimator of the far-field induced voltage on a PCB trace was proposed. Based on it, an estimator of the radiated susceptibility of a printed-circuit board based on near-field scan results is derived and validated through two validation case studies.

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“…(1) can be rewritten to (6), where LCE and LCH are the coupling lengths associated to E and H-fields. The RS estimator (4) can be rewritten to (9).…”

Section: B Practical Implementation Of the Estimation Methodsmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

On the Correlation Between Near-Field Scan Immunity and Radiated Immunity at Printed Circuit Board Level – Part II

Boyer

Nolhier

Caignet

et al. 2022

IEEE Trans. Electromagn. Compat.

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“…1(a)) [5], [8]; and (b) semi-rigid coaxial cable probes (see Fig. 1(b)) [3], [13], [15], [16]. Probes belonging to the former group exhibit geometries carefully designed to optimize coupling and field directivity performance.…”

Section: Characteristics Of Immunity Tests and Injection Probesmentioning

confidence: 99%

Investigation of Semi-Rigid Coaxial Test Probes as RF Injection Devices for Immunity Tests at PCB Level

Grassi

Spadacini

et al. 2020

IEEE Access

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This work investigates the performance of RF immunity procedures exploiting semi-rigid coaxial test probes as coupling devices to inject continuous wave (CW) RF power into the outlets of Integrated Circuits (ICs). Two solutions are presented, both offering the advantage with respect to the traditional direct power injection method, to run the test without removing the IC from its actual PCB. The first procedure resorts to near-field coupling to inject the noise into an interconnecting trace. The second procedure requires metallic contact between the probe tip and the injection point (e.g., a via or an IC pin). Specific figures of merit, such as coupling and power efficiency, test repeatability and intrusiveness, sensitivity to setup parameters and lateral spatial resolution, are introduced and used to ascertain the effectiveness of the proposed procedures. To this end, both numerical simulations and measurements were carried out on several PCBs. Feasibility of the proposed immunity procedures is eventually proven by an application example, involving a thermal sensor as device under test. INDEX TERMS Direct power injection, Microstrip line, Near-field probe, Radiated Immunity, Radio Frequency.

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“…9 illustrates the geometrical and the electrical equivalent models. Vertical electric EZ and tangential magnetic Hx fields contribute to generate distributed electromotive force and current along the line, as given by (1) and (2). They contribute to the voltages induced across each terminal of the line, whose expressions are given by (3) and (4).…”

Section: A Description Of the Modelmentioning

confidence: 99%

“…These tests require a precise control of all measurement parameters to ensure a sufficient repeatability of the results. Moreover, anticipating risks of failures needs an analysis of the field to line or equipment coupling mechanisms, making modeling and simulation unavoidable [1] [2] [3]. However, reliable measurement tools are also required to validate simulation results.…”

Section: Introductionmentioning

confidence: 99%

A new Voltage Measurement Probe for investigating Radiated Immunity Test

Boyer

Dhia

Durier

2020

2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE

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Diagnosis of failures induced during radiated immunity tests in anechoic chamber and validation of field-toline coupling models require measurements of the induced voltages at the input of electronic equipments. Although such measurements seem obvious at first sight, they can become complicated and erroneous due to measurement conditions. This paper describes the design a miniature high-frequency voltage probe to solve this issue. This probe is validated experimentally by a comparison with simulation.

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Comparison of voltages induced in an electronic equipment during far field and near field normative radiated immunity tests

Cited by 11 publications

References 4 publications

On the Correlation Between Near-Field Scan Immunity and Radiated Immunity at Printed Circuit Board Level – Part II

On the Correlation Between Near-Field Scan Immunity and Radiated Immunity at Printed Circuit Board Level – Part II

Investigation of Semi-Rigid Coaxial Test Probes as RF Injection Devices for Immunity Tests at PCB Level

A new Voltage Measurement Probe for investigating Radiated Immunity Test

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