2007 IEEE International Symposium on Circuits and Systems (ISCAS) 2007
DOI: 10.1109/iscas.2007.378775
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Comparative Analysis of Process Variation Impact on Flip-Flop Power-Performance

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Cited by 23 publications
(10 citation statements)
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“…Differently from the study presented in [6], where the process variability impact was analyzed considering FF circuits conventionally optimized for minimum EDP, we performed a comparative analysis considering yield improved circuit structures. This paper is organized as follows.…”
Section: Figmentioning
confidence: 99%
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“…Differently from the study presented in [6], where the process variability impact was analyzed considering FF circuits conventionally optimized for minimum EDP, we performed a comparative analysis considering yield improved circuit structures. This paper is organized as follows.…”
Section: Figmentioning
confidence: 99%
“…FFs targeted for high speed applications in energy-constrained environments are conventionally sized to optimize the energy-delay-product (EDP) [6]. However, due to random process variations, a large number of circuits might not meet the targeted EDP constraint.…”
Section: Introductionmentioning
confidence: 99%
“…Flip-flop is a data storage element. The operation of the flip-flops is done by its clock frequency [3]. When multistage FlipFlop is operated with respect to clock frequency, it processes with high clock switching activity and then increases time latency.…”
Section: Introductionmentioning
confidence: 99%
“…Unfortunately, when applied to a set of static and dynamic FFs, non-negligible power and area overheads are experienced [6]. In [7], it is demonstrated that, when conventionally optimized for minimum power-delay-product (PDP), static FFs present the best tolerance to process uncertainties, whereas high-performance pulsed topologies are more sensitive to random process variability.…”
Section: Introductionmentioning
confidence: 99%
“…Comparative studies presented in [5][6][7][8][9] refer to circuits optimized without taking into account energy variability, which is a very important issue in leakage-dominated technologies [1]. Moreover, the process variability impact on local interconnects is neglected.…”
Section: Introductionmentioning
confidence: 99%