2015
DOI: 10.1063/1.4905865
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Comment on “Assessment of field-induced quantum confinement in heterogate germanium electron–hole bilayer tunnel field-effect transistor” [Appl. Phys. Lett. 105, 082108 (2014)]

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Cited by 3 publications
(7 citation statements)
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“…This response complements the pertinent comment by Hsu et al 3 reinforcing the HG-EHBTFET reliability at low drain voltages and provides an explanation for the observed behavior of the eigenenergy difference between the first bound states for electrons in the overlap and underlap regions when increasing / tg2 . FIG.…”
supporting
confidence: 64%
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“…This response complements the pertinent comment by Hsu et al 3 reinforcing the HG-EHBTFET reliability at low drain voltages and provides an explanation for the observed behavior of the eigenenergy difference between the first bound states for electrons in the overlap and underlap regions when increasing / tg2 . FIG.…”
supporting
confidence: 64%
“…1(b) in Ref. 3) that there exists an optimized value of / tg2 for which DE turns out to be approximately independent of V D . Our response seeks to explain the interesting behavior of the DEðV D Þ curves depicted in Fig.…”
mentioning
confidence: 99%
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