2009
DOI: 10.1109/ted.2009.2026200
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Closed-Form Expressions of 3-D Via Resistance, Inductance, and Capacitance

Abstract: Abstract-Closed-form expressions of the resistance, capacitance, and inductance for interplane 3-D vias are presented in this paper. The closed-form expressions account for the 3-D via length, diameter, dielectric thickness, and spacing to ground. A 3-D numerical simulation is used to extract electromagnetic solutions of the resistance, capacitance, and inductance for comparison with the closed-form expressions, revealing good agreement between simulation and the physical models. The maximum error for the resi… Show more

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Cited by 180 publications
(78 citation statements)
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References 22 publications
(29 reference statements)
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“…[95][96][97] The equivalent TSV self-capacitance is an important parameter for RC delay, which needs to be considered during TSV design. The equivalent TSV inductance is also important for interconnect performance such as SSN that is determined by TSV length.…”
Section: Temperature Distribution and Thermal Stressesmentioning
confidence: 99%
“…[95][96][97] The equivalent TSV self-capacitance is an important parameter for RC delay, which needs to be considered during TSV design. The equivalent TSV inductance is also important for interconnect performance such as SSN that is determined by TSV length.…”
Section: Temperature Distribution and Thermal Stressesmentioning
confidence: 99%
“…This filter is described in this section. The resistance, inductance, and capacitance per unit length of the interconnects (Metal 3) and 3-D vias are extracted based on the predictive technology model (PTM) [23]- [25], as listed in Table I. The width of the interconnects is determined by the maximum current density of the MITLL 3-D technology.…”
Section: B Distributed 3-d Filtermentioning
confidence: 99%
“…In [22], Friedman et al have developed the closed form expressions for a 3D via. Closed form expressions for R, L and C developed in [22] are for a single 3D via.…”
Section: Figure 24 Equivalent Circuit Model Of Through Silicon Via Gmentioning
confidence: 99%
“…In [22], Friedman et al have developed the closed form expressions for a 3D via. Closed form expressions for R, L and C developed in [22] are for a single 3D via. Though these expressions cannot be used directly for a group of TSVs, it provides a good model to understand the electrical behavior of Through Silicon Vias.…”
Section: Figure 24 Equivalent Circuit Model Of Through Silicon Via Gmentioning
confidence: 99%
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