1991
DOI: 10.1002/chin.199125029
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ChemInform Abstract: An Etching Mechanism of Ta by Chlorine‐Based Plasmas

Abstract: ChemInform is a weekly Abstracting Service, delivering concise information at a glance that was extracted from about 100 leading journals. To access a ChemInform Abstract of an article which was published elsewhere, please select a “Full Text” option. The original article is trackable via the “References” option.

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“…The rates of tantalum etching rates can reach also the values of several µm per minute [38,39]. Different Mo or Ta halide molecules are released to plasma [36] and then destroyed and ionised by electron impact in the discharge region, however, small amounts of molecular halide ions are observed after mass-separation.…”
Section: Methodsmentioning
confidence: 99%
“…The rates of tantalum etching rates can reach also the values of several µm per minute [38,39]. Different Mo or Ta halide molecules are released to plasma [36] and then destroyed and ionised by electron impact in the discharge region, however, small amounts of molecular halide ions are observed after mass-separation.…”
Section: Methodsmentioning
confidence: 99%
“…The [3]. The C1 atom i n t e n s i t y (the major etching species) measure by OES (725.6nm) increases with RF bias but i s not very sensitive t o i t (Fig.…”
Section: Resultsmentioning
confidence: 99%