Characterizing the gate to source nonlinear capacitor role on FET IMD performance

Abstract

This paper discusses the gate to source nonlinear capacitor contribution on small signal intermodulation distortion (IMD) performance of FET devices. The second and third order coefficients for the Cgs(Vgs) Taylor-series expansion, experimentally extracted with a simplified one-sided version of our previously proposed test set-up, are shown to be responsible for some detected differences on IMD behavior at high frequencies.