2008
DOI: 10.1016/j.apsusc.2008.02.156
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Characterization of soft-X-ray detectors fabricated with high-quality CVD diamond thin films

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Cited by 15 publications
(6 citation statements)
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“…The significant increase in the current signal with increasing bias voltage can be interpreted as described in previous reports [15][16][17][18] where the higher the bias voltage, the greater the charge collection in the device and hence the rapid rate of e-h recombination phenomenon can be overcome. However the dark current increases.…”
Section: I-v Characteristicsmentioning
confidence: 99%
“…The significant increase in the current signal with increasing bias voltage can be interpreted as described in previous reports [15][16][17][18] where the higher the bias voltage, the greater the charge collection in the device and hence the rapid rate of e-h recombination phenomenon can be overcome. However the dark current increases.…”
Section: I-v Characteristicsmentioning
confidence: 99%
“…7,8 A diamond detector has superior physical properties to a Si detector. 2, 8 Therefore, a DAD detector can be a compact electron detector for SEM with small dark current and high gain. 9 Additionally, the leakage current and dark noise are small because of a wide gap energy ͑5.5 eV͒.…”
Section: Introductionmentioning
confidence: 99%
“…9 Additionally, the leakage current and dark noise are small because of a wide gap energy ͑5.5 eV͒. 8 To evaluate the sensitivity to electrons, a DAD current I DAD was measured with a focused electron beam irradiating on the DAD detector. 2 For diamonds, E e-h is estimated to be 13.3 eV.…”
Section: Introductionmentioning
confidence: 99%
“…An impact ionization mechanism due to field enhancement in the electrode edge was suggested as the reason for the photocurrent gain at high applied biases. 11 This field enhancement, however, is difficult to explain the increase in the photocurrent at the temperature from RT to 65°C, since the impact ionization will be suppressed monotonically due to phonon scattering at elevated temperatures. 12 Considering the facts that ͑i͒ a gain larger than unity appears at high biases ͑i.e., 32 V͒ and is accompanied by a slow time response, ͑ii͒ the gain decreases when the measurement temperature is above 105°C at high biases ͑i.e., 32 V͒, and ͑iii͒ the photocurrent shows no dependence on the DUV intensity or the measurement temperature at low biases ͑i.e., 5 V͒, we propose that the gain larger than unity is related to charge trapping at the metal/diamond interface during DUV illumination.…”
mentioning
confidence: 97%
“…8,11 In both cases, the ohmic contact was a prerequisite because charge injection led to the gain. In the present study, no post-annealing treatment was applied.…”
mentioning
confidence: 98%