1999
DOI: 10.1063/1.123669
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Cathodoluminescence enhancement in porous silicon cracked in vacuum

Abstract: Correlations between the morphology and emission properties of trench defects in InGaN/GaN quantum wells J. Appl. Phys. 113, 073505 (2013) Depth-resolved cathodoluminescence spectroscopy of silicon supersaturated with sulfur Appl. Phys. Lett. 102, 031909 (2013) Whispering gallery and Fabry-Pérot modes enhanced luminescence from individual ZnO micro mushroom J. Appl. Phys. 113, 034313 (2013) Morphological, structural, and emission characterization of trench defects in InGaN/GaN quantum well structures … Show more

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Cited by 17 publications
(15 citation statements)
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“…This intense red CL emission was similar to the one obtained by Ref. [13]. In all our samples, we also observed a stable but weaker CL emission in the blue regime of the spectrum and from its known features seems to be associated with SiO x defects in the PSi surface [4].…”
Section: Resultssupporting
confidence: 85%
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“…This intense red CL emission was similar to the one obtained by Ref. [13]. In all our samples, we also observed a stable but weaker CL emission in the blue regime of the spectrum and from its known features seems to be associated with SiO x defects in the PSi surface [4].…”
Section: Resultssupporting
confidence: 85%
“…This experimental setup included Secondary Ion Mass Spectroscopy (SIMS) and scanning Auger microprobe capabilities. Contrary to the experimental systems used in most of the previous reports on CL from PSi [2,3,5,[8][9][10][11][13][14][15][16], our observations were made in the vacuum environment of an analytical surface analysis system, rather than inside a scanning electron microscope (SEM) or transmission electron microscope (TEM) chamber. Our experimental setup allowed us to perform in situ elemental analyses of the samples during the CL studies in a relatively high vacuum ($5 Â 10 À9 Torr).…”
Section: Methodsmentioning
confidence: 86%
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“…There were however few works on the related system of nanocrystalline silicon in SiO x matrices that suggested that the blue emission in those materials is also correlated with the nanostructures 10,11 . Several authors attributed the fewer works on CL to the weak and unstable signal obtained from PSi materials as compared with the PL emission 12,13 but more recent reports have indicated intense and stable red emission from PSi 14,15,16 and, although no exact overlap of the PL and CL was demonstrated, suggested a correlation of these emissions with the nanoparticles and their PL spectra.…”
Section: Introductionmentioning
confidence: 93%
“…Briefly, most of the corresponding reports already devoted to the CL in PSi deal with the assignment of the origin of the CL emissions and ascribe the higher energy emissions to bulk SiO x defects [1][2][3][4][5].On the other hand, there are few reports on the related system of silicon nanocrystallites that are embedded in SiO x matrices, which suggest that the blue emission from the composites is correlated with the nanostructures [6,7]. Other reports have indicated however intense and stable red CL emission from PSi [8][9][10] and, although no exact overlap of the PL and CL was demonstrated, a correlation of these two types of spectra was implied. A more recent report on the temperature dependence of the CL intensity at high frequencies suggests that the corresponding emissions are related to the silicon nanostructure rather than to the SiO x matrix [11].…”
mentioning
confidence: 99%