BPF-Based Thermal Sensor Circuit for On-Chip Testing of RF Circuits

Abstract

A new sensor topology meant to extract figures of merit of radio-frequency analog integrated circuits (RF-ICs) was experimentally validated. Implemented in a standard 0.35 μm complementary metal-oxide-semiconductor (CMOS) technology, it comprised two blocks: a single metal-oxide-semiconductor (MOS) transistor acting as temperature transducer, which was placed near the circuit to monitor, and an active band-pass filter amplifier. For validation purposes, the temperature sensor was integrated with a tuned radio-frequency power amplifier (420 MHz) and MOS transistors acting as controllable dissipating devices. First, using the MOS dissipating devices, the performance and limitations of the different blocks that constitute the temperature sensor were characterized. Second, by using the heterodyne technique (applying two nearby tones) to the power amplifier (PA) and connecting the sensor output voltage to a low-cost AC voltmeter, the PA’s output power and its central frequency were monitored. As a result, this topology resulted in a low-cost approach, with high linearity and sensitivity, for RF-IC testing and variability monitoring.

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“…rough comparative analysis, it is found that the nRF24LE1 radio frequency chip produced by Nordic has the characteristics of ultra-low-power consumption, small size, long range, and low cost. nRF24LE1 is a highly integrated, ultra-low-power consumption, system-on-chip technology 2.4 GHz radio frequency chip [11]. It integrates a radio frequency transceiver, an enhanced 51 FLASH high-speed microcontroller, and a wealth of peripherals and interfaces in a very small package.…”