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Abstract-Two inexpensive waveguide absorbing loads are constructed and measured, each using a single thin resistive sheet absorber supported by styrofoam walls, and 50mm in length. It is found that a V-cut wedge displays less reflection than a tapered wedge, with -30 dB reflection across a band 8.5 -12.4 GHz.

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We present, experimental broadband propagation characterization of a planar groove gap waveguide (PGGWG) from 29 to 40 GHz. The transmission line Q‐factor is found to vary from 110 to 130 over the band, which is shown by comparison of measurement data to be comparable to substrate integrated waveguide (SIW). PGGWG is found to have a phase constant of nearly double that of SIW using the same materials and manufacturing process. This is a significant result for system miniaturization.

Oscillation-based testing (OBT) has been proven to be a simple, yet effective VLSI test for numerous circuit types. This paper investigates, for the first time, the application of OBT verification for second generation current conveyors (CCIIs). The OBT is formed by connecting the CCII into a simple Wien bridge oscillator and monitoring both the amplitude and frequency of oscillation. The fault detection rate, taking into account both the open and short circuit fault simulation analyses, indicates 96.34% fault coverage using a combination of amplitude and frequency output sensing in all technology corners. The only nondetected faults are short circuits between DD and SS , which can be detected using other techniques such as IDDQ testing. This method is found to be sensitive to resistor and capacitor process variation in the Wien bridge oscillator, but mitigating test steps are proposed.

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Analogue signal processing (ASP) is a promising alternative to DSP techniques in future telecommunication and data processing solutions. Second-order all-pass delay networks -the building blocks of ASPs -are currently primarily implemented in off-chip planar media, which is unsuited for volume production. In this work, a novel on-chip CMOS secondorder all-pass network is proposed that includes a post-production tuning mechanism. It is shown that automated tuning with a genetic local optimizer can compensate for CMOS process variation and parasitics, which make physical realization otherwise infeasible. Measurements indicate a post-tuning bandwidth of 280 MHz, peak-to-nominal delay variation of 10 ns and magnitude variation of 3.1 dB. This is the first time that measurement results have been reported for an active inductorless on-chip second-order all-pass network with a delay Q-value larger than 1.