Built-In Oscillation-Based Self-Testing of a 2.4 GHz LNA in &lt;tex&gt;$0.35\mu \mathrm{m}$&lt;/tex&gt; CMOS

Nel, Hendrik P.; Stander, Tinus; Dualibe, Fortunato

doi:10.1109/icecs.2018.8618052

“…Future work will include improving sensitivity for large relative phase shift states, prototyping and characterizing the detectability of phase shift error under stress, as well as implementing differential power detection of f0 as demonstrated in [9], [10]. ACKNOWLEDGMENT…”

Section: Simulation Resultsmentioning

confidence: 99%

Single-Ended Oscillation-Based Test Technique for Passive RF Phase Shifters

Venter¹,

Stander²

2022

Preprint

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Phased array systems have become paramount to the development of next generation wireless communication networks, with errors on phase shifters contributing to beam pointing error. Oscillation-based built-in self-testing (OBIST) of phase shifters may improve on this accuracy. We propose a single-ended oscillation-based test technique for passive RF phase shifters. The method uses a negative resistance oscillator topology, where the phase shifter is used to capacitively load the active negative resistance circuit resulting in a dependency between relative phase shift and output oscillation frequency. Simulation results indicate an average sensitivity of 0.14 MHz/° of phase shift around a nominal 617 MHz output oscillation when testing an X-band reflection-type phase shifter, while the addition of OBT circuitry increases the phase shifter’s mid-band insertion loss by 0.93 dB.

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“…Future work will include improving sensitivity for large relative phase shift states, prototyping and characterizing the detectability of phase shift error under stress, as well as implementing differential power detection of f0 as demonstrated in [10], [11], [12].…”

Section: Simulation Resultsmentioning

confidence: 99%

Single-Ended Oscillation-Based Test Technique for Passive RF Phase Shifters

Venter¹,

Stander²

2022

Preprint

Self Cite

0

View full text Add to dashboard Cite

Phased array systems have become paramount to the development of next generation wireless communication networks, with errors on phase shifters contributing to beam pointing error. Oscillation-based built-in self-testing (OBIST) of phase shifters may improve on this accuracy. We propose a single-ended oscillation-based test technique for passive RF phase shifters. The method uses a negative resistance oscillator topology, where the phase shifter is used to capacitively load the active negative resistance circuit resulting in a dependency between relative phase shift and output oscillation frequency. Simulation results indicate an average sensitivity of 0.14 MHz/° of phase shift around a nominal 617 MHz output oscillation when testing an X-band reflection-type phase shifter, while the addition of OBT circuitry increases the phase shifter’s mid-band insertion loss by 0.93 dB.

show abstract

“…Future work will include improving sensitivity for large relative phase shift states, prototyping and characterizing the detectability of phase shift error under stress, as well as implementing differential power detection of f0 as demonstrated in [10], [11], [12].…”

Section: Simulation Resultsmentioning

confidence: 99%

Single-Ended Oscillation-Based Test Technique for Passive RF Phase Shifters

Venter

¹

,

Stander

²

2021

2021 15th International Conference on Advanced Technologies, Systems and Services in Telecommunications (TELSIKS)

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Phased array systems have become paramount to the development of next generation wireless communication networks, with errors on phase shifters contributing to beam pointing error. Oscillation-based built-in self-testing (OBIST) of phase shifters may improve on this accuracy. We propose a singleended oscillation-based test technique for passive RF phase shifters. The method uses a negative resistance oscillator topology, where the phase shifter is used to capacitively load the active negative resistance circuit resulting in a dependency between relative phase shift and output oscillation frequency. Simulation results indicate an average sensitivity of 0.14 MHz/° of phase shift around a nominal 617 MHz output oscillation when testing an Xband reflection-type phase shifter, while the addition of OBT circuitry increases the phase shifter's mid-band insertion loss by 0.93 dB..

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Built-In Oscillation-Based Self-Testing of a 2.4 GHz LNA in <tex>$0.35\mu \mathrm{m}$</tex> CMOS

Cited by 9 publications

References 12 publications

Single-Ended Oscillation-Based Test Technique for Passive RF Phase Shifters

Single-Ended Oscillation-Based Test Technique for Passive RF Phase Shifters

Single-Ended Oscillation-Based Test Technique for Passive RF Phase Shifters

Single-Ended Oscillation-Based Test Technique for Passive RF Phase Shifters

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