Oscillation-based testing (OBT) has been proven to be a simple, yet effective VLSI test for numerous circuit types. This paper investigates, for the first time, the application of OBT verification for second generation current conveyors (CCIIs). The OBT is formed by connecting the CCII into a simple Wien bridge oscillator and monitoring both the amplitude and frequency of oscillation. The fault detection rate, taking into account both the open and short circuit fault simulation analyses, indicates 96.34% fault coverage using a combination of amplitude and frequency output sensing in all technology corners. The only nondetected faults are short circuits between DD and SS , which can be detected using other techniques such as IDDQ testing. This method is found to be sensitive to resistor and capacitor process variation in the Wien bridge oscillator, but mitigating test steps are proposed.

a new CMOS voltage reference, which takes advantage of the temperature dependence of NMOS and PMOS threshold voltages, is presented. Due to the circuit architecture the mobility factor is completely cancelled. It does not use resistors and all transistors works in strong inversion. The circuit is simple, opamp-less and can be implemented in a standard CMOS process. When the input power supply changes from 1.8V to 2.1V and the temperature changes from -20 to 80ºC, simulations for the reference circuit using the proposed architecture shows an output voltage of 1.184V and a T FC of 100 ppm/ºC.

This paper presents a proof of concept performed on a new and very simple CMOS circuit configuration that implements a radiation dosimeter based on the threshold voltage difference (VTH) principle. The circuit used does not use resistors and all the transistors work in strong inversion, their mobility factor being completely canceled by the proposed architecture. Its operation exploits the relationship between radiation and VTH shifting, which allows, through a circuit configuration, to compensate for temperature variation and amplify the reaction to radiation, making it ideal for integrated industrial applications due to its simplicity and good operation. The circuit was designed for operation in areas naturally at risk of radiation, for example nuclear power plants or radiological clinics. Its advantage over other circuits that perform similar functions is mainly its low cost and simplicity of design.

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Abstract-Oscillation based testing (OBT) has

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