Material composition plays a crucial
role in the device performance;
thus, nonvolatile memory devices from a small molecule named 5-mercapto-1-methyl
tetrazole (MMT) in an insulating polymer matrix of poly(4-vinyl pyridine)
(PVP) were fabricated. The composition of the active material in the
device was varied to observe its influence on the device’s
electronic properties. The device with a more or less weight ratio
of MMT has a much smoother surface morphology, whereas when the contributions
of MMT and PVP were equal, the average surface roughness increased.
However, the maximum on–off current ratio for all the devices
is 105, suggesting that the MMT molecule does not show
any change in its characteristic properties when surrounded by an
insulating material. When the device was fabricated without the polymer
matrix, the surface morphology of the device completely changed as
it was filled with large holes. These holes provide short-circuited
pathways for the current by forming the direct metal contact between
the top and bottom electrodes. The carrier transport through these
devices follows various conduction mechanisms. Some of the dominating
conduction mechanisms are direct tunneling and trap-free and trap-assisted
space–charge-limited conduction.