IEEE International Symposium on Performance Analysis of Systems and Software, 2005. ISPASS 2005. 2005
DOI: 10.1109/ispass.2005.1430581
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Balancing Performance and Reliability in the Memory Hierarchy

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Cited by 93 publications
(55 citation statements)
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“…Since soft errors induced during the vulnerable phases in the data cache only present the potential to crash the execution or the lower memory hierarchies, TVF defines the upper bound on AVF and can be estimated more accurately than AVF. Further, TVF is also different from the critical time [15] in that the critical time is calculated based on the word-level vulnerability analysis while TVF is derived from a flexible lifetime model for detailed vulnerability analysis at various granularities, e.g., a cacheline, a word, or a byte.…”
Section: Tvfmentioning
confidence: 99%
See 1 more Smart Citation
“…Since soft errors induced during the vulnerable phases in the data cache only present the potential to crash the execution or the lower memory hierarchies, TVF defines the upper bound on AVF and can be estimated more accurately than AVF. Further, TVF is also different from the critical time [15] in that the critical time is calculated based on the word-level vulnerability analysis while TVF is derived from a flexible lifetime model for detailed vulnerability analysis at various granularities, e.g., a cacheline, a word, or a byte.…”
Section: Tvfmentioning
confidence: 99%
“…Such a study could provide enough insight into cache reliability behavior, which the designer could take advantage of to design highly costeffective reliable caches. Recent papers [8], [9], [10], [1], [15], [16] present some initial efforts toward such a cache vulnerability analysis. However, their cacheline-or wordbased vulnerability characterization used some simple generation model [17] that could not explore the temporal vulnerability of the cache, i.e., how different lifetime phases of the cache data contribute to vulnerability.…”
Section: Introductionmentioning
confidence: 99%
“…Transient fault model Transient faults within the cache are mainly caused by alpha particles hitting the flip-flops of the cache [9,17]. The physical procedure of the particle-hits causing faults is complex and the effect depends on many factors, like the energy transferred from the particle into the circuit, the transistor size, etc.…”
Section: Preliminariesmentioning
confidence: 99%
“…Cache reliability is mainly threatened by transient faults, caused by strikes from alpha particles and energetic particles [9]. When a memory cell (flip-flop) is hit by such a particle, though the circuit itself is not damaged, the stored bit value can flip and cause an error.…”
Section: Introductionmentioning
confidence: 99%
“…For cache flusing, the operating system or the hardware flushes the cache to reduce its vulnerable lifetime, resulting in lower AVFs [87,88].…”
Section: Hardware Techniquesmentioning
confidence: 99%