Automatic control system for memory chips performance in a radiation experiment

Automated Data Processing System for Oscilloscope Measurements during an Environmental Test

“…The Figure 2 shows the front panel of the program. The program allows the waveform to be saved as a png file (Figure 3), and, as seen on Figure 2, can be easily integrated as a functional unit of the test system [6][7][8][9][10][11][12], and allows us to work with the oscilloscope remotely, if necessary [13].…”

Hardware-Software Complex for Functional and Parametric Tests of ARM Microcontrollers STM32F1XX

“…Interface blocks operate in the following speeds: USART -115200 bit/s; SPI -4000000 bit/s. RAM and FLASH memory testing consists of writing a 32-bit control word to all memory cells with subsequent reading [11,12]. Read word is compared to a reference; if they are not equal failure of a memory cell is recorded.…”

Testing System for Analog Devices Direct Digital Synthesizer

“…Control and measurement system was designed on the basis of automated setup that included National Instruments PXI module devices and software developed in LabVIEW development environment [7][8][9][10][11][12][13][14].…”