1995
DOI: 10.1016/0143-8166(95)00036-n
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Automated fine grid technique for measurement of large-strain deformation maps

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Cited by 59 publications
(40 citation statements)
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“…Emission wavelength (nm) (7,5) Strain-induced spectral shifts are greatest for small roll-up angles (near-"zigzag") and smallest for large angles (near-"armchair"). Another important feature is that the peaks of one class of semiconducting SWCNTs (the "mod 1" nanotubes, for which mod (n-m,3) = 1) shift down in wavelength when they are axially stretched while the peaks of the other class ("mod 2") shift oppositely under the same deformation.…”
Section: Normalized Emission Intensitymentioning
confidence: 99%
See 1 more Smart Citation
“…Emission wavelength (nm) (7,5) Strain-induced spectral shifts are greatest for small roll-up angles (near-"zigzag") and smallest for large angles (near-"armchair"). Another important feature is that the peaks of one class of semiconducting SWCNTs (the "mod 1" nanotubes, for which mod (n-m,3) = 1) shift down in wavelength when they are axially stretched while the peaks of the other class ("mod 2") shift oppositely under the same deformation.…”
Section: Normalized Emission Intensitymentioning
confidence: 99%
“…8 The interferometric techniques, including holography, interferometry, speckle interferometry, etc., usually require a model of actual structure, tedious calculations to separate the values of principal stresses, and expensive equipment. Non-interferometric techniques like the grid method, 5 and digital image correlation (DIC) 6,7 suffer from some other limitations, such as the requirements for a random gray intensity distribution or speckle pattern distribution, heavy dependence on the quality of the imaging system, relatively low strain measurement accuracy in small deformation measurements, and the inability to measure strains induced when the object is not directly observed by the imaging system. Over the past two decades, Raman spectroscopy has been explored by many researchers in strain sensing applications.…”
mentioning
confidence: 99%
“…In order that this can be converted to displacement in mm in the object plane, an appropriate scaling factor (mm / pixels) must be applied. This was determined by taking a radiograph of a grid of known pitch placed in the same plane as the specimen speckle pattern [54,58,59] and then performing a 2D…”
Section: A C C E P T E D Accepted Manuscriptmentioning
confidence: 99%
“…It is necessary to do a 2D Fourier transform since any rotation of the grid with respect to the spectral axes will result in the resolved components on each axis being a different frequency to the true grid pitch. The image is then inverse Fourier transformed and the phase is calculated and unwrapped [58,59] . The phase plane gradient gives the grid periodicity in pixels from which an accurate scale-factor for the imaged speckle pattern can be determined.…”
Section: A C C E P T E D Accepted Manuscriptmentioning
confidence: 99%
“…Grids have been used to measure the deformation in hot rolling 7 and cold extrusion 8 and in general to calculate large strains during compression at room temperature. 9 Timothy et al 7 used an engraved insert embedded in a sample in a rolling experiment and the grid survived large deformation. If an insert is used, it is essential that the insert does not detach from the specimen during deformation since in that case, the grid would not be representative of the deformation of a sample without insert.…”
Section: Introductionmentioning
confidence: 99%