"Analytical Methods in Photoemission Electron Microscopy"

Wegmann, L.

doi:10.1525/9780520323230-013

Search citation statements

Order By: Relevance

Paper Sections

Select...

Introduction1

Citation Types

Supporting

Mentioning

Contrasting

Year Published

1974

1976

Publication Types

Select...

Book2

Article1

Relationship

Self Cite0

Independent3

Authors

Journals

Cited by 3 publications

(2 citation statements)

References 0 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Recently Flournoy et al (1) described a thin-layer thickness measuring instrument based on the use of Fourier transform spectroscopy. Referring to the thickness d of a transparent coating of refractive index n on an opaque or transparent substrate they state that the distance between two side bursts equals 2 dn, ignoring any phase shift.…”

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Investigations of Carbon Residues on Surfaces of Silicon Integrated Circuits

Fontana¹,

Decosterd²,

Wegmann³

1974

J. Electrochem. Soc.

View full text Add to dashboard Cite

show abstract

Section: Introductionmentioning

confidence: 99%

“…4). Wegmann (1) proposed that such material contrasts were at least partly produced by contamination layers. This paper is a study on this hypothesis and the possible correlations between material contrasts and the doping of diffused areas in integrated circuits.…”

mentioning

confidence: 99%