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2012 38th IEEE Photovoltaic Specialists Conference 2012
DOI: 10.1109/pvsc.2012.6317764
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Analysis of tandem III–V/SiGe devices grown on Si

Abstract: This paper introduces the modeling developed to assess the potential of a III-V/SiGe tandem device. Demonstration of value will be executed via materials and solar cell device models. III-V top cell candidates are evaluated and a high-value composition is identified. Initial windowless GaAsP solar cells demonstrate a bandgap-voltage offset of 0.58.

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Cited by 29 publications
(28 citation statements)
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“…0.86 eV indirect bandgap). This final composition was chosen because previous calculations [5] predicted that this tandem bandgap combination was near the current match between GaAsP and SiGe and therefore the optimized AM1.5G architecture for this material combination. The grade was accomplished in under 5 μm of epitaxy, thus allowing for further III-V growth without reaching the cracking limit [17].…”
Section: Sige On Simentioning
confidence: 99%
See 1 more Smart Citation
“…0.86 eV indirect bandgap). This final composition was chosen because previous calculations [5] predicted that this tandem bandgap combination was near the current match between GaAsP and SiGe and therefore the optimized AM1.5G architecture for this material combination. The grade was accomplished in under 5 μm of epitaxy, thus allowing for further III-V growth without reaching the cracking limit [17].…”
Section: Sige On Simentioning
confidence: 99%
“…Previously we presented calculations for a modified Shockley-Queisser [4] evaluation of III-V/SiGe lattice-matched tandem solar cells [5]. We identified an ideal III-V top subcell ternary material, gallium arsenide phosphide (GaAsP), and provided a direction for initial experimental work.…”
Section: Introductionmentioning
confidence: 99%
“…Both GaAsP and SiGe materials can be compositionally tuned to span a broad range of bandgaps opening possibility for multijunction cells with internal lattice-matching between GaAsP and SiGe. While the unconstrained two-terminal 2J ideal efficiency is 41.7% under AM1.5g for a bandgap combination of 1.73/ 1.13 eV, the predicted efficiency for 2J GaAsP/SiGe cell is 39.4% (AM1.5g) under lattice-matched conditions (with bandgaps of 1.54/0.84 eV) (Schmieder et al 2012). Diaz et al (2014) improvement in the higher wavelength regime.…”
Section: Si X Ge 1-x Graded Buffersmentioning
confidence: 92%
“…Fig. 3 shows the bandgap-V OC offset (W OC ) of various III-V devices with respect to TDD [23]. This also illustrates the importance of lattice matching as a lattice matched structure will limit any further formation of threading dislocations.…”
Section: Tdd Improvementmentioning
confidence: 94%
“…Reported W OC vs TDD data from literature showing the correlation between the material quality and the device performance[23].…”
mentioning
confidence: 99%