Analog Boundary-Scan Description Language (ABSDL) for Mixed-Signal Board Test

Suparjo, B.S.; Ley, Adam W; Cron, Adam; Ehrenberg, H.

doi:10.1109/test.2006.297708

Cited by 6 publications

(1 citation statement)

References 3 publications

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“…There has been research on analog scan based design for debug. Although the analog scan standard IEEE 1149.1/1149.4 [1,2] is in practice for board level debugging, it is not popular for circuit level testing of analog/RF IPs in SoCs. Current based analog scan chain was proposed in [3,4] by Soma et.al.…”

Section: Introductionmentioning

confidence: 99%

Post silicon validation of analog/mixed signal/RF circuits and systems: recent advances

Chatterjee

Deyati

Muldrey

2016

2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW)

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Technology scaling along with unprecedented levels of device integration has led to increasing numbers of analog/mixed-signal/RF design bugs escaping into silicon. Such bugs are manifested under specific system-on-chip (SoC) operating conditions and their effects are difficult to predict apriori. This paper describes recent advances in detecting and diagnosing such bugs using "guided" stochastic test stimulus generation algorithms. A key challenge is that unlike traditional test generation for manufacturing test that is predicated on known failure mechanisms, the nature of design bugs is generally unknown and must be discovered on-the-fly. Classes of design errors from undesired capacitive coupling and incorrect biasing conditions to incorrect guard-banding of designs are considered. It is shown that high design bug coverage can be obtained over a range of test cases.

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Section: Introductionmentioning

confidence: 99%

Post silicon validation of analog/mixed signal/RF circuits and systems: recent advances

Chatterjee

Deyati

Muldrey

2016

2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW)

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show abstract

Testing hybrid systems with TTCN-3 embedded

Grossmann

2013

Int J Softw Tools Technol Transfer

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A testing language typically provides a set of test automation statements that allows for a systematic definition and automatic application of stimulation data (i.e. messages or signals) to a system under test. Moreover, it eases the assessment of the systemâs reaction by providing customizable evaluation statements and functions. TTCN-3, the Testing and Test Control Notation, already provides universal and powerful concepts to describe tests for discrete, message-based systems. However, software-based control systems that are used to control physical processes often show continuous quantities that can be only poorly stimulated and assessed by means of the currently available language constructs in TTCN-3. In this article, we show how this problem can be solved by extending the TTCN-3 language. We introduce an extension of TTCN-3, namely TTCN-3 embedded, that provides concepts and constructs that directly address the specification of tests for continuous and hybrid real time systems. The extension includes the notion of streams that can be used to represent continuous quantities over time. In addition, TTCN-3 has been extended with the concepts of stream-based ports, sampling, equation systems, and with additional control flow structures. The concepts are integrated with standard TTCN-3 and allow for defining test cases that handle continuous quantities, as well as discrete state changes and the exchange of messages within the same concept space. The feasibility of the approach is shown by providing a small example from the automotive industry

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Methods of Testing Discrete Semiconductors in the 1149.4 Environment

Hannu

Moilanen

2007

J Electron Test

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Analog Boundary-Scan Description Language (ABSDL) for Mixed-Signal Board Test

Cited by 6 publications

References 3 publications

Post silicon validation of analog/mixed signal/RF circuits and systems: recent advances

Post silicon validation of analog/mixed signal/RF circuits and systems: recent advances

Testing hybrid systems with TTCN-3 embedded

Methods of Testing Discrete Semiconductors in the 1149.4 Environment

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