Methods of Testing Discrete Semiconductors in the 1149.4 Environment

Hannu, Jari; Moilanen, M.

doi:10.1007/s10836-007-5007-5

Cited by 3 publications

(1 citation statement)

References 7 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…However, mixed-signal circuits are much more complex than digital circuits, not to mention its difficulty, complexity and unpredictability of testing. It does not like the IEEE 1149.1 standard that has been widely accepted by chip design and production companies [2] . The commercialization of IEEE 1149.1 test system also has hundreds of species, but there is no commercialization of IEEE 1149.4 test system analog circuit test system that support the analog circuit test [3] , mainly due to the following:…”

Section: Introductionmentioning

confidence: 99%

Design of analog test hardware platform based on IEEE 1149.4

Jia

2009

2009 9th International Conference on Electronic Measurement &Amp; Instruments

View full text Add to dashboard Cite

IEEE 1149.4 infrastructure has provided effective solutions for the boundary scan test of the mixed-signal circuit. For the analog testing, the boundary-scan test for mixed signal is very important as well as difficult, since there is no commercialized automatic test equipment up to now. This paper analyzes the standard IEEE 1149.4 test architecture and specifications, and designs an analog test hardware platform base on this standard. It provides low-cost automatic tool for analog circuit in IEEE 1149.4 environment, so as to enhance the test capability for the analog circuit. All indicators of platform meet the requirements of analog circuits in the IEEE 1149.4 environment. The measurement results are presented at the end.

show abstract

Section: Introductionmentioning

confidence: 99%