Abstract:Technology scaling along with unprecedented levels of device integration has led to increasing numbers of analog/mixed-signal/RF design bugs escaping into silicon. Such bugs are manifested under specific system-on-chip (SoC) operating conditions and their effects are difficult to predict apriori. This paper describes recent advances in detecting and diagnosing such bugs using "guided" stochastic test stimulus generation algorithms. A key challenge is that unlike traditional test generation for manufacturing te… Show more
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