2013
DOI: 10.1063/1.4817272
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A simple criterion for predicting multicrystalline Si solar cell performance from lifetime images of wafers prior to cell production

Abstract: The aim of this paper is to clarify which mean value can be used to predict multicrystalline Si (mc-Si) solar cell performance from lifetime distributions on wafers prior to production. Therefore, a numerical device simulation model is presented that predicts cell performance very precisely from lifetime distributions. This model is used to derive a simple lifetime averaging procedure, which can be used as a criterion for excluding low-quality wafers from production. Compared with standard mean values such as … Show more

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Cited by 24 publications
(11 citation statements)
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“…2, and the square-root-weighted harmonic mean Lifetime for each sample, calculated as ~ = li; ~. wh.ich is proportional to the vTov n y'T1 harmonic mean minority-carrier diffusion length and a strong predictor of cell performance [26]- [28], is reported in Table I.…”
Section: A Lifetime Impact Of One-and Two-step High-temperature Gettmentioning
confidence: 99%
“…2, and the square-root-weighted harmonic mean Lifetime for each sample, calculated as ~ = li; ~. wh.ich is proportional to the vTov n y'T1 harmonic mean minority-carrier diffusion length and a strong predictor of cell performance [26]- [28], is reported in Table I.…”
Section: A Lifetime Impact Of One-and Two-step High-temperature Gettmentioning
confidence: 99%
“…[ 77 ] The spatially resolved minority carrier lifetime after gettering was evaluated for samples from adjacent ingot heights and thus sharing the same crystal defect structure by microwave photoconductive decay with iodine ethanol surface passivation. The resulting harmonic root mean minority carrier lifetime, τ av , a strong predictor of cell effi ciency, [80][81][82] and calculated as…”
Section: Process Optimization Resultsmentioning
confidence: 99%
“…Shockley–Read–Hall (SRH) model with two defect levels is used to account for the injection dependent minority carrier lifetime. Due to the spatial inhomogeneous lifetime of mc‐Si, there are several methods that can be applied for providing input to numerical simulations . To account for the spatial variation between different grains, the lifetime on a representative region of a sister wafer to the cell is measured with the Sinton lifetime tester .…”
Section: Simulationmentioning
confidence: 99%