A Novel 65 nm Radiation Tolerant Flash Configuration Cell Used in RTG4 Field Programmable Gate Array

Wang, Jih-Jong; Rezzak, Nadia; Dsilva, Durwyn; Jia, Jingyi; Cai, Alex; Hawley, Frank; McCollum, J.; Hamdy, E.

doi:10.1109/tns.2015.2495262

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Cited by 16 publications

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“…FPGA (field programmable gate array) is an important class of integrated circuit device used in aerospace electronics. There are mainly three kinds of FPGAs, the antifuse-based FPGA [1,2] , the flashbased FPGA [3−6] and the SRAM-based FPGA [7,8] . Among them, the antifuse-based FPGA is one-time programmable (OTP) and only a limited density could be reached.…”

Section: Introductionmentioning

confidence: 99%

Reliability evaluation on sense-switch p-channel flash

Song¹,

Liu²,

Zhang³

et al. 2021

J. Semicond.

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In this paper, the reliability of sense-switch p-channel flash is evaluated extensively. The endurance result indicates that the p-channel flash could be programmed and erased for more than 10 000 cycles; the room temperature read stress shows negligible influence on the p-channel flash cell; high temperature data retention at 150 °C is extrapolated to be about 5 years and 53 years corresponding to 30% and 40% degradation in the drive current, respectively. Moreover, the electrical parameters of the p-channel flash at different operation temperature are found to be less affected. All the results above indicate that the sense-switch p-channel flash is suitable to be used as the configuration cell in flash-based FPGA.

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