A design-for-test methodology for active analog filters

Soma, M.

doi:10.1109/test.1990.114017

Cited by 113 publications

(27 citation statements)

References 12 publications

(8 reference statements)

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“…Several DfT studies have been published, including work on a current mode DAC where test vectors are optimised and redundancies removed 9 , on analogue filters where the controllability and observability is improved to test a number of stages separately 10,11,12,13 and on flash ADC 14,15 . Motivated by the success of the 1149.1 scan bus, the IEEE Mixed-Signal Testability Bus Standard P1149.4 has been developed 16,17 which despite little interest to date, is likely to radically improve test access at the chip level.…”

Section: State-of-the-art In Analogue and Mixed Signal Testingmentioning

confidence: 99%

A design for testability study on a high performance automatic gain control circuit

Lechner

Richardson

Hermes

et al.

Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231)

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Section: State-of-the-art In Analogue and Mixed Signal Testingmentioning

confidence: 99%

A design for testability study on a high performance automatic gain control circuit

Lechner

Richardson

Hermes

et al.

Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231)

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“…In the analog case, the first attempt to apply the idea of the scan path to test filters was made by (Soma, 1990). The basis of this design-for-testability methodology consists of dynamically broadening the bandwidth of each stage of a filter, in order to improve the controllability and observability of circuit internal nodes.…”

Section: Design-for-testmentioning

confidence: 99%

Test and Design-for-Test of Mixed-Signal Integrated Circuits

Lubaszewski

Huertas

Information Technology

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Although most electronic circuits are almost entirely digital, many include at least a small part that is essentially analog. This is due to the need to interface with the real physical world, that is analog in nature. As demanding market segments require ever more complex mixed-signal solutions, high quality tests become essential to meet circuit design specifications in terms of reliability, time-to-market, costs, etc. In order to lower costs associated to traditional specification-driven tests and, additionally, achieve acceptable fault coverages for analog and mixed-signal circuits, it is reasonable to expect that no other solution than a move towards defect-oriented design-for-test methods will be applicable in the near future. Therefore, testing tends to be dominated by embedded mechanisms to allow for accessibility to internal test points, to achieve on-chip test generation, on-chip test response evaluation, or even to make it possible the detection of errors concurrently to the circuit application. Within this context, an overview of existing test methods is given in this chapter, focusing on design-for-testability, built-in self-test and self-checking techniques suitable for the detection of realistic defects in analog and mixedsignal integrated circuits.Analog and mixed-signal test, fault modelling, fault simulation, test generation, defect-oriented test, design-for-test, design-for-testability, built-in self-test, self-checking circuits. Abstract:Keywords:

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“…A great deal of effort has been devoted to testing pure analog circuits [3], [5]. Approaches for designing testable analog and mixed circuits have also been reported [6], [8], but up to now there is no general and efficient solution. The most frequently encountered parts of mixed digital and analog circuits are digital-to-analog (D/A) and analog-to-digital (A/D) converters, which bridge the gap between digital and analog systems.…”

Section: Introductionmentioning

confidence: 99%