A New Built-in Self-test Approach For Digital-to-analog And Analog-to-digital Converters

Abstract

Abstract

A simple built-in current sensor for IDDQ testing of CMOS data converters

“…However, this method suffers from performance degradation in complex integrated circuits since it is not usually possible to divide the circuit into the fundamental blocks such as current mirrors, loads, amplifiers and multiplexers. Built in selftest method (BIST) is based on measuring the output data and calculating the performance of the system using on-chip circuitry [6,7]. This method also suffers from performance degradation and does not cover physical defects.…”

BIST Method for Die-Level Process Parameter Variation Monitoring in Analog/Mixed-Signal Integrated Circuits

“…A large amount of sampled data must be collected to support both methods. The approach reported in [4] relies on analog circuitry and reference voltages for measurements and allows testing of only DAC-based ADCs. In the oscillation-test method proposed in [5], the impact of the control logic delay and the imperfect analog BIST circuitry on the test accuracy is not assessed.…”

“…The proposed DLPM method is evaluated on an analog to digital converter (ADC) as the appropriate representative. Although several attempts [1][2][3][4][5][6][7][8] have been made to alleviate increasing test difficulties of ADC testing, none of these methods provides the possibilities for early identification of excessive process parameter variations. In [1], the on-chip delta-sigma DAC for sine wave generation and DSP techniques for data analysis are utilized.…”

A multi-converter DFT technique for complex SIP: Concepts and validation

“…To overcome these problems, several authors have proposed different BIST techniques where signals are internally generated and/or analysed [1][2][3][4][5][6][7]. Another possible and less expensive solution consists in using DFT techniques to internally transform the analogue signals into digital signals that are made controllable and observable from the chip I/Os [3,8,9].…”