ESSCIRC Conference 2016: 42nd European Solid-State Circuits Conference 2016
DOI: 10.1109/esscirc.2016.7598282
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A column-and-row-parallel CMOS image sensor with thermal and 1/f noise suppression techniques

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“…In combination with the second-order topology, the conversion time improves, resulting in high A pixel /(A ADC T * ADC ). Second-order I ADCs are also used in [41] and [42] in which the latter dynamically reduces the quantization step by choosing a smaller V ref for low-light signals (since the quantization noise is more dominant at low-light levels). This results in less cycles and a 2.75 times improvement of T * ADC with a small overhead due to the additional comparator.…”
Section: A Noise Versus Speedmentioning
confidence: 99%
“…In combination with the second-order topology, the conversion time improves, resulting in high A pixel /(A ADC T * ADC ). Second-order I ADCs are also used in [41] and [42] in which the latter dynamically reduces the quantization step by choosing a smaller V ref for low-light signals (since the quantization noise is more dominant at low-light levels). This results in less cycles and a 2.75 times improvement of T * ADC with a small overhead due to the additional comparator.…”
Section: A Noise Versus Speedmentioning
confidence: 99%