Abstract:C‐axis‐aligned crystalline‐oxide semiconductor field‐effect transistor (CAAC‐OS FET) can be scaled down to a width and a length of 60 nm. We fabricated an organic light‐emitting diode (OLED) display with more than 5000 ppi, which is required in virtual reality (VR) display applications, using CAAC‐OS FETs as the backplane.
“…The overlay between OLED layer and the PDL opening is the Organic Overlap (OO), and the distance between patterned OLED layers is the organic gap (OG). The aperture ratio of the OLED devices is defined as (POW/PP) 2 . The pixel pitch is POW + 2*OO + OG.…”
Resolution and brightness are the essential figure‐of‐merits for the microdisplay development needed for AR and VR applications. In this presentation, we show our technology development toward high‐resolution FMM‐free direct R‐G‐B OLED microdisplays. We show the schematic fabrication setup and integration route to fabricate red, green, and blue OLED pixels side‐by‐side by the OLED photolithographic patterning processes. We demonstrate a 1µm line and space feature with the photoresist and transfer the pattern to an OLED stack. With the high resolution of photoresist, high aperture ratio, and high‐resolution multicolor OLED pixel arrays are demonstrated. We also investigate the possible OLED degradations induced in the photolithography process. With the innovations in the process steps, OLED stacks, process environments, and photoresists, we demonstrate a breakthrough in the reliability of photolithography patterned OLED.
“…The overlay between OLED layer and the PDL opening is the Organic Overlap (OO), and the distance between patterned OLED layers is the organic gap (OG). The aperture ratio of the OLED devices is defined as (POW/PP) 2 . The pixel pitch is POW + 2*OO + OG.…”
Resolution and brightness are the essential figure‐of‐merits for the microdisplay development needed for AR and VR applications. In this presentation, we show our technology development toward high‐resolution FMM‐free direct R‐G‐B OLED microdisplays. We show the schematic fabrication setup and integration route to fabricate red, green, and blue OLED pixels side‐by‐side by the OLED photolithographic patterning processes. We demonstrate a 1µm line and space feature with the photoresist and transfer the pattern to an OLED stack. With the high resolution of photoresist, high aperture ratio, and high‐resolution multicolor OLED pixel arrays are demonstrated. We also investigate the possible OLED degradations induced in the photolithography process. With the innovations in the process steps, OLED stacks, process environments, and photoresists, we demonstrate a breakthrough in the reliability of photolithography patterned OLED.
“…We made a prototype of 5291-ppi OLED display using the above CAAC-IGZO FETs [22]. Specifications of the prototyped panel are summarized in Table 1.…”
Section: -Ppi Oled Display With Caac-igzo Fetmentioning
confidence: 99%
“…Besides, aiming at expanding the CAAC-IGZO technology to LSI process over a Si substrate, we have worked on scaling CAAC-IGZO FETs and succeed in fabrication of transistors with a channel length on the order of hundreds to several tens nanometers. With use of the scaled CAAC-IGZO FETs, we developed high-definition displays with 2000 ppi and 5000 ppi and reported them at SID Display Week in 2019 [21,22].…”
For high-definition microdisplays with more than several thousands of pixels per inch (ppi), c-axis-aligned crystal indium-gallium-zinc oxide (CAAC-IGZO) field-effect transistors (FETs) are effective devices. Based on such a viewpoint, we have fabricated a 5291-ppi organic light-emitting diode (OLED) display using CAAC-IGZO FETs with a channel length of 60 nm.
“…The highest cost component in most large field of view (FOV) NTE systems are the imagers, usually followed by the cost of optics. Semiconductor Energy Laboratory Co, Ltd.'s recent demonstration of 5291 ppi active matrices for microdisplays using oxide semiconductors (OS) should potentially resolve several of the most serious issues for NTE headsets once OS backplane microdisplays are mass-produced on large flexible substrates [1,2].…”
Section: Ultra-small Oxide Active Matrix Transistorsmentioning
VR and AR near‐to‐eye (NTE) technologies offer the potential for an ultimate large display experience with extreme portability at low‐cost for medical, workstation, entertainment, and communications applications, among others. However, AR and VR have yet to achieve even a small fraction of this potential to date. Seven recent technical advances are among key developments that may finally bring virtual imaging to the display market forefront.
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