23.2 A 40A Shunt-Based Current Sensor with ±0.2% Gain Error from −40°C to 125°C and Self-Calibration

Tang, Zhong; Toth, Nandor G.; Zamparette, Roger; Nezuka, Tomohiro; Furuta, Yoshikazu; Makinwa, Kofi A. A.

doi:10.1109/isscc42615.2023.10067304

2023 IEEE International Solid- State Circuits Conference (ISSCC) 2023

DOI: 10.1109/isscc42615.2023.10067304

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23.2 A 40A Shunt-Based Current Sensor with ±0.2% Gain Error from −40°C to 125°C and Self-Calibration

Zhong Tang

Nandor G. Toth

Roger Zamparette

et al.

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Cited by 2 publications

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Thermal Noise Analysis of Accumulation-based S/H Circuit for Shunt Current Sensing

Yarragunta,

Aprile,

Fugger

et al. 2023

2023 30th IEEE International Conference on Electronics, Circuits and Systems (ICECS)

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Thermal Noise Analysis of Accumulation-based S/H Circuit for Shunt Current Sensing

Yarragunta,

Aprile,

Fugger

et al. 2023

2023 30th IEEE International Conference on Electronics, Circuits and Systems (ICECS)

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3.4 A 14b 98Hz-to-5.9kHz 1.7-to-50.8 μ W BW/Power Scalable Sensor Interface with a Dynamic Bandgap Reference and an Untrimmed Gain Error of ± 0.26 % from −40°C to 125°C

Tang,

Liu,

Chen

et al. 2024

2024 IEEE International Solid-State Circuits Conference (ISSCC)

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23.2 A 40A Shunt-Based Current Sensor with ±0.2% Gain Error from −40°C to 125°C and Self-Calibration

Cited by 2 publications

References 6 publications

Thermal Noise Analysis of Accumulation-based S/H Circuit for Shunt Current Sensing

Thermal Noise Analysis of Accumulation-based S/H Circuit for Shunt Current Sensing

3.4 A 14b 98Hz-to-5.9kHz 1.7-to-50.8 μ W BW/Power Scalable Sensor Interface with a Dynamic Bandgap Reference and an Untrimmed Gain Error of ± 0.26 % from −40°C to 125°C

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