Thermal Noise Analysis of Accumulation-based S/H Circuit for Shunt Current Sensing

Yarragunta, Jaya Satyanarayana; Aprile, Antonio; Fugger, Andreas; Conzatti, Francesco; Bonizzoni, Edoardo; Malcovati, Piero

doi:10.1109/icecs58634.2023.10382882

2023 30th IEEE International Conference on Electronics, Circuits and Systems (ICECS) 2023

DOI: 10.1109/icecs58634.2023.10382882

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Thermal Noise Analysis of Accumulation-based S/H Circuit for Shunt Current Sensing

Jaya Satyanarayana Yarragunta,

Antonio Aprile,

Andreas Fugger

et al.

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Thermal Noise Analysis of Accumulation-based S/H Circuit for Shunt Current Sensing

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