2005
DOI: 10.1088/0268-1242/20/5/022
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1/fnoise in Langmuir–Blodgett films on silicon

Abstract: Low-frequency noise properties of 100 nm-thick Langmuir-Blodgett (LB) films of stearic acid in a metal-insulator-semiconductor (MIS) structure have been studied as a function of frequency and leakage current. The excess noise is found to be consistently 1/f -like within a range of frequencies between 1 Hz to 1 kHz when leakage current is varied from 10 −8 A to 10 −4 A. The sources of noises are identified; the trap density is estimated to be 3.6 × 10 18 m −2 eV −1 .

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Cited by 15 publications
(7 citation statements)
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“…The noise current decreases at a higher frequency and increases at a larger reverse bias due to the larger dark current. The device shows small noise currents of o1 pA Hz À 1/2 , which is about one order of magnitude smaller than that of a silicon diode 30 . The NEP of the photodetector is calculated to be 4.6 Â 10 À 12 W at 550 nm ( À 100 mV, 3 kHz) and 4.2 Â 10 À 12 W at 700 nm ( À 100 mV, 3 kHz).…”
Section: Resultsmentioning
confidence: 84%
“…The noise current decreases at a higher frequency and increases at a larger reverse bias due to the larger dark current. The device shows small noise currents of o1 pA Hz À 1/2 , which is about one order of magnitude smaller than that of a silicon diode 30 . The NEP of the photodetector is calculated to be 4.6 Â 10 À 12 W at 550 nm ( À 100 mV, 3 kHz) and 4.2 Â 10 À 12 W at 700 nm ( À 100 mV, 3 kHz).…”
Section: Resultsmentioning
confidence: 84%
“…It is noteworthy that the device shows low noise currents of <2 pA Hz –1/2 , which is smaller than that of a silicon diode (ca. 10 pA Hz –1/2 ) …”
Section: Resultsmentioning
confidence: 99%
“…The increase in the performance was mostly attributed to the very low dark noise of 2 pA Hz -1/2 which is comparable to silicon diodes. [95] On the other hand, the photovoltage rise and fall time under 254 nm (42 µW cm -2 ) was determined as fast as 64 ms and 43 ms, respectively ( Figure 4d). One performance limiting factor of the utilized GQDs of the deep UV photodetector is the IQE of only 6%.…”
Section: Graphene Quantum Dot-based Photodetectorsmentioning
confidence: 93%