1/f noise as a diagnostic tool to investigate the quality of isotropic conductive adhesive bonds

Vandamme, L.K.J.; Perichaud, Marie-Genevieve; Noguera, E.; Danto, Yves; Behner, U.

doi:10.1109/6144.796549

Cited by 18 publications

(5 citation statements)

References 17 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…A very noisy contribution is assumed to be in series with an almost noise-free contribution similar to multispot contact problems. 9,[34][35][36] The onset of contact degradation leads to current crowding and enhanced noise. The noise of a large part of the series resistance can remain unaffected by the degradation.…”

Section: Agingmentioning

confidence: 99%

“…Our results support the hypothesis where current crowding was proposed to explain the increase of r s with aging. 7,9,34,35 We assume that the degradation takes place in the semitransparent platinum top layer. This very thin layer ͑Ϸ5 nm͒ could degrade easily with temperature treatments and also could be very sensitive to electromigration degradation at high current density.…”

Section: Agingmentioning

confidence: 99%

See 1 more Smart Citation

Low-frequency noise sources in as-prepared and aged GaN-based light-emitting diodes

Bychikhin

Pogány

Vandamme

et al. 2005

Journal of Applied Physics

View full text Add to dashboard Cite

The low-frequency noise sources are investigated in as-prepared and aged GaN light-emitting diodes ͑LEDs͒. Accelerated aging is performed by thermal ͑300 h at 240°C͒ and electrical forward-bias stressing ͑20 and 50 mA for 2500 h͒. At low currents I Ͻ I RTS , where I RTS is a critical current, the low-frequency noise is dominated by random telegraph signal ͑RTS͒ noise on top of the 1/ f noise. An explanation is given for the giant relative current jumps ⌬I / I Ϸ 50% and an expression for I RTS is derived. The RTS noise in our devices is a less-sensitive diagnostic tool for studying the results of accelerated aging. Two components of the 1 / f noise were observed: one is related to the quantum-well junction and the other is due to series resistance noise. The two 1 / f spectra have different current dependences. It was found that the junction 1 / f noise is not significantly affected by aging. However, a strong increase in series resistance noise, by a factor of 60-800 compared to unstressed devices, is observed after strong electrical and thermal aging. This high increase goes hand in hand with a relatively small increase in the value of the series resistance ͑13%-90%͒. This makes 1 / f noise a very sensitive reliability indicator for GaN LEDs after accelerated aging. We discuss the physical origin of LED degradation.

show abstract

Section: Agingmentioning

confidence: 99%

Section: Agingmentioning

confidence: 99%

Low-frequency noise sources in as-prepared and aged GaN-based light-emitting diodes

Bychikhin

Pogány

Vandamme

et al. 2005

Journal of Applied Physics

View full text Add to dashboard Cite

show abstract

“…However, contact problems with the soldered devices cannot be completely dismissed. Indeed, a non perfect ohmic contact may generate 1/f noise when submitted to a DC current [24].…”

Section: Cryogenic Oscillator Design and Measurementmentioning

confidence: 99%

A Low Phase Noise All Cryogenic Microwave Oscillator Based on a Superconductor Resonator

Chaudy

Llopis

Marcilhac

et al. 2020

IEEE Trans. Ultrason., Ferroelect., Freq. Contr.

View full text Add to dashboard Cite

A 1 GHz full cryogenic oscillator is presented. The oscillator is based on a planar superconductor resonator featuring a loaded Q factor of 200 000 at low microwave input power (unloaded Q of 400 000) and on amplifying parts realized with SiGe bipolar transistors. The circuit is designed with an harmonic balance software and realized on alumina substrate. A nonlinear model is extracted at low temperature both for the transistor and the resonator. This double nonlinearity increases the difficulty of the oscillator design and implies a strategy to limit the power inside the resonator. The vibrations of the cryogenerator are also a serious issue to get high performance. Finally, the oscillator features a phase noise of-112 dBc/Hz at 100 Hz offset frequency and a phase noise floor of-170 dBc/Hz (100 kHz offset) at a temperature of 65 K.

show abstract

“…Runde et al have developed an off-line diagnosis method based on the non-linearity of the resistance of degraded contacts [36]. Vandamme et al have found that the measurement of noise across contacts is an indication of the degradation of the contacts [37].…”

Section: A Current Carryingmentioning

confidence: 99%

A review of methods for condition monitoring, surveys and statistical analyses of disconnectors and circuit breakers

Westerlund

Hilber

Lindquist

et al. 2014

2014 International Conference on Probabilistic Methods Applied to Power Systems (PMAPS)

View full text Add to dashboard Cite

Abstract-There is a need for a new survey of conditionmonitoring methods for circuit breakers and disconnectors, since during the last two decades less than ten surveys have been carried out. The paper presents several statistical surveys and analyses. The methods of condition monitoring found are reviewed and classified according to the different types of failure identified in the surveys. Some research gaps are identified, such as the prediction of the degradation of the contacts, the signal processing of coil and motor currents and the switching.

show abstract

1/f noise as a diagnostic tool to investigate the quality of isotropic conductive adhesive bonds

Cited by 18 publications

References 17 publications

Low-frequency noise sources in as-prepared and aged GaN-based light-emitting diodes

Low-frequency noise sources in as-prepared and aged GaN-based light-emitting diodes

A Low Phase Noise All Cryogenic Microwave Oscillator Based on a Superconductor Resonator

A review of methods for condition monitoring, surveys and statistical analyses of disconnectors and circuit breakers

Contact Info

Product

Resources

About