In order to minimise human exposure to aflatoxin M1 (AFM1) the levels of this highly carcinogenic mycotoxin in milk, heat-treated milk, and other dairy products have been limited to <0.05 μg kg-1. However, its removal from dairy products presents a challenge for dairy producers, as commercial additives change organoleptic properties, and filtration alone yields poor results. The aim of this study was to find a strain of lactic acid bacteria (LAB) from milk or dairy products that most effectively binds AFM1 and to see whether heat treatment of the selected LAB affects the binding efficiency. We also wanted to investigate whether centrifugation can improve filtering of the obtained AFM1-LAB complexes from milk. To do that, we isolated and identified 10 native LAB species/strains, incubated their viable or heat-treated cells (108 CFU mL-1) in milk spiked with 0.5 μg L-1of AFM1 at 4 °C for 0, 2, 4, and 24 h, and quantified the amount of unbound AFM1 with HPLC. AFM1 binding efficiency ranged from 21 to 92 % for viable cells and from 26 to 94 % for the heattreated ones. Since both viable and heat-treated Lactobacillus plantarum KM showed the best results, we used it for the next step in AFM1 removal from milk. Heat treatment in combination with filtration and centrifugation yielded removal as high as 96 %.
SummaryIn this paper the effect of aflatoxin B1, ochratoxin A and zearalenon on morphology, growth parameters and metabolic activity of yeasts Saccharomyces cerevisiae, Saccharomyces uvarum, Candida utilis and Kluyveromyces marxianus was determined. The results showed that the three mycotoxins affected the morphology of all these yeasts, primarily the cell diameter, but not their final cell count. Fourier transform infrared spectroscopy showed that the yeast membranes bound the mycotoxins, C. utilis in particular. The cell membranes of most yeasts underwent denaturation except S. uvarum exposed to ochratoxin A and zearalenone. In the early *Corresponding author: Phone: +385 (0)1 4605 045; E-mail: zjakopovic@pbf.hr ORCID IDs: 0000-0001-6448-484X (Jakopović), 0000-0002-5020-0639 (Hanousek Čiča), 0000-0001-8066-5851 (Mrvčić), 0000-0002-5608-0658 (Pucić), 0000-0003-0973-138X (Čanak), 0000-0003-1022-4377 (Frece), 0000-0002-0768-0462 (Pleadin), 0000-0002-8720-9063 (Stanzer), 0000-0002-5123-7687 (Zjalić), 0000-0001-9188-366X (Markov) Food Technology and Biotechnology 56 (2) 2018 www.ftb.com.hrPlease note that this is an unedited version of the manuscript that has been accepted for publication. This version will undergo copyediting and typesetting before its final form for publication. We are providing this version as a service to our readers. The published version will differ from this one as a result of linguistic and technical corrections and layout editing.stage of fermentation, all mycotoxin-exposed yeasts had lower metabolic activity and biomass growth than controls, but fermentation products and biomass concentrations reached the control levels by the end of the fermentation, except for C. utilis exposed to 20 µg/mL of zearalenone.The adaptive response to mycotoxins suggests that certain yeasts could be used to control mycotoxin concentrations in the production of fermented food and beverages.
Original scientific paperTemperature management and control are among the most critical functions in power electronic devices. Knowledge of power semiconductor's operating temperature is important for circuit design, as well as for converter control. Virtual junction temperature measurement or estimation is not an easy task, therefore designing the appropriate circuitry for virtual junction temperature in the real operating conditions not affecting regular circuit operation is a demanding task for engineers. The proposed method enables virtual junction temperature estimation based on the real-time measurement of semiconductor's quasi-threshold voltage using dedicated modified gate driver circuit.Key words: IGBT, Measurement, Threshold voltage, Temperature sensitive electrical parameter Mjerenje radne temperature IGBT-a u stvarnom vremenu. Upravljanje temperaturom je jedna od najkritični-jih funkcija kod učinskih poluvodičkih komponenata. Poznavanje radne temperature učinske poluvodičke sklopke vrlo je važno pri projektiranju sklopa, kao i za upravljanje učinskim pretvaračem. Mjerenje ili estimacija nadomjesne temperature silicija nije lagan zadatak, stoga je projektiranje odgovarajućeg sklopovlja za odreivanje nadomjesne temperature silicija u stvarnim radnim uvjetima, koje ne utječe na normalan rad sklopa, vrlo zahtjevan inžen-jerski zadatak. Predložena metoda omogućava odreivanje nadomjesne temperature silicija utemeljeno na mjerenju kvazi-napona praga u stvarnom vremenu pomoću posebno prilagoenog pobudnog stupnja IGBT-a.Ključne riječi: IGBT, mjerenje, napon praga, temperaturno osjetljiv električki parametar
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